2022
DOI: 10.1002/adma.202107734
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A High‐Performance In‐Memory Photodetector Realized by Charge Storage in a van der Waals MISFET

Abstract: explosive increase in data information, however, significantly challenges the conventional von Neumann architecture in which sensing, memory, and computing functions are realized by discrete devices. In this circumstance, the integration of multifunctions in a single device, such as in-memory photodetectors, is regarded as an ideal solution to this problem. [7][8][9][10] These devices can not only dramatically simplify the conventional image sensor circuitry, but also be applied as a wide variety of photonic s… Show more

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Cited by 26 publications
(16 citation statements)
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“…Under the positive gate voltage and UV light irradiation, the C 12 -BTBT layer absorbs light to generate photo-excited holeelectron pairs, subsequently, the electrons are injected into the LUMO level of the PS layer under the gate electric field, so that the transfer curve of the transistor shifts more to the positive direction. [10,[61][62] According to the above experimental results, we conclude that after introducing charge trapping sites on the PS surface by plasma treatment, holes can be rapidly injected into PS in a short time to form surface electrets, which shifts the threshold voltage of the transistor to the negative direction, so that the transistor maintains high resistance state (i.e., low drain current) in a wide range of gate voltage. Nevertheless, the surface electret charges are sensitive to UV light and can be rapidly released under UV light irradiation, allowing the transistor to revert to a low resistance state (i.e., high drain current) within a certain gate voltage range.…”
Section: Resultsmentioning
confidence: 73%
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“…Under the positive gate voltage and UV light irradiation, the C 12 -BTBT layer absorbs light to generate photo-excited holeelectron pairs, subsequently, the electrons are injected into the LUMO level of the PS layer under the gate electric field, so that the transfer curve of the transistor shifts more to the positive direction. [10,[61][62] According to the above experimental results, we conclude that after introducing charge trapping sites on the PS surface by plasma treatment, holes can be rapidly injected into PS in a short time to form surface electrets, which shifts the threshold voltage of the transistor to the negative direction, so that the transistor maintains high resistance state (i.e., low drain current) in a wide range of gate voltage. Nevertheless, the surface electret charges are sensitive to UV light and can be rapidly released under UV light irradiation, allowing the transistor to revert to a low resistance state (i.e., high drain current) within a certain gate voltage range.…”
Section: Resultsmentioning
confidence: 73%
“…Therefore, this photosensitive transistor is suitable for use as a photodetector, but a setup process of introducing surface electret by negative gate-bias stress is essential before each detection, which ensures that the response of the drain current is proportional to the UV light intensity. [10,63] The holes injected into PS can be released under UV light, and the device operation is sensitive to light intensity. Therefore, the changes in device state caused by electret charge release under UV light can be used as the basis of photodetectors.…”
Section: Resultsmentioning
confidence: 99%
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“…34 In particular, multi-functional high performance optoelectronic devices are highly pursued, where the image sensing and processing functions in separated vision chips can integrate together for promoting the efficiency of the vision system. Nowadays, more functions in computing photonic chips are being developed, such as edge computing, 35 in memory detection, 36 motion detection 37 and broadband convolutional processing. 38 Here, by utilizing electronic extraction layer ZnO and a faceon orientation of D-A molecular packing in a D-A/graphene system, we explore the graphene/ZnO/PTB7-Th:IEICO-4F BHJ field-effect transistor with prominent infrared broadband photo-response (488-1064 nm) and photo-storage phenomena.…”
mentioning
confidence: 99%
“…34 In particular, multi-functional high performance optoelectronic devices are highly pursued, where the image sensing and processing functions in separated vision chips can integrate together for promoting the efficiency of the vision system. Nowadays, more functions in computing photonic chips are being developed, such as edge computing, 35 in memory detection, 36 motion detection 37 and broadband convolutional processing. 38…”
mentioning
confidence: 99%