A high constancy and noise suppression voltage shift generator in SEIR-based BIST circuit for ADC linearity test

Huang, Yiyao; Fu, Guolong; Zhang, Xianghui; Xiong, Yuzhou; Zhang, Yanbo; Liu, Shubin; Zhu, Zhangming

doi:10.1016/j.mejo.2024.106341

Microelectronics Journal

2024

DOI: 10.1016/j.mejo.2024.106341

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A high constancy and noise suppression voltage shift generator in SEIR-based BIST circuit for ADC linearity test

Yiyao Huang,

Guolong Fu,

Xianghui Zhang

et al.

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A high constancy and noise suppression voltage shift generator in SEIR-based BIST circuit for ADC linearity test

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