This is the peer reviewed version of the following article: Freire, F. Quiñoá, E.; Riguera, R.; "Chiral nanostructure in polymers under different deposition conditions observed using atomic force microscopy of monolayers: poly(phenylacetylene)s as a case study" Chemical Communications, 2017, 53, 481-492 PPAs by atomic-force microscopy (AFM) are presented, with special attention to the methods for the preparation of monolayers, and their consequences in the quality of the AFM images. Thus, monolayers formed by drop casting, spin coating followed by crystallization or annealing, Langmuir-Blodgett and Langmuir-Schaefer methods, onto highly oriented pyrolytic graphite (HOPG) or mica are described, together with the AFM images and the resulting helical structure obtained for different PPAs. Also, some conclusions are assessed both on the adequacy of the different techniques for the formation of monolayers and on the solid supports employed to elucidate the secondary structure of different PPAs.