1980
DOI: 10.1111/j.1749-6632.1980.tb47213.x
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A Grazing Incidence Microscope for X‐ray Imaging Applications

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Cited by 14 publications
(9 citation statements)
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“…The merit of an imaging system (e.g., a microscope or telescope) is based on two primary requirements: (1) stigmatism, i.e., pointlike, imaging between a particular object-image pair; and (2) uniform magnification independent of where a ray strikes the optical aperture. The famous sine rule of Abbe1 7 states that a nearly uniform magnification is obtained if the ratio in sines of the incident and reflected angles, made with the axis joining object and image, is constant across the mirror aperture. This is equivalently stated as requiring a fixed image/object distance ratio (r'/r) resulting in focal planes oriented normal to the optical axis.…”
Section: A Aplanatismmentioning
confidence: 99%
“…The merit of an imaging system (e.g., a microscope or telescope) is based on two primary requirements: (1) stigmatism, i.e., pointlike, imaging between a particular object-image pair; and (2) uniform magnification independent of where a ray strikes the optical aperture. The famous sine rule of Abbe1 7 states that a nearly uniform magnification is obtained if the ratio in sines of the incident and reflected angles, made with the axis joining object and image, is constant across the mirror aperture. This is equivalently stated as requiring a fixed image/object distance ratio (r'/r) resulting in focal planes oriented normal to the optical axis.…”
Section: A Aplanatismmentioning
confidence: 99%
“…A variation of the type I Wolter design [16], [17], in which the parabolic surface is replaced by an ellipsoid, has found application for collecting the radiation at 13.5 nm emitted from a small hot plasma used as a source in Extreme UltraViolet (EUV) microlithography [18]- [21], currently considered a promising technology in the semiconductor industry for the next generation lithographic tools. More recently, a new optical design has recently been proposed [22], [23] in which the above condition on the two reflection angles is satisfied for all rays incident on each mirror.…”
Section: Introductionmentioning
confidence: 99%
“…For applications to EUV lithography, where the source is at finite distance, a variation of the type I Wolter design, already proposed for other applications [23], [24] is used. In this configuration, the parabolic surface is replaced by an ellipsoid, so that the object focus is brought to finite distance from the optics.…”
Section: Introductionmentioning
confidence: 99%