1988
DOI: 10.1088/0022-3719/21/7/003
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A geometric explanation of the temperature dependence of the quantised Hall resistance

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Cited by 33 publications
(12 citation statements)
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“…The deviation of the resistance plateaus from precise quantization is caused by the large bias current and the wide, extended Hall voltage contacts in our device ( Fig. 2a), which mix a significant fraction of the longitudinal resistance into the Hall resistance 35 . The Hall coefficient R H = I −1 (∂V H /∂B) ( Fig.…”
Section: Resultsmentioning
confidence: 92%
“…The deviation of the resistance plateaus from precise quantization is caused by the large bias current and the wide, extended Hall voltage contacts in our device ( Fig. 2a), which mix a significant fraction of the longitudinal resistance into the Hall resistance 35 . The Hall coefficient R H = I −1 (∂V H /∂B) ( Fig.…”
Section: Resultsmentioning
confidence: 92%
“…2(b)]. Similar anomalous “overshoot” of the quantized value for the Hall resistance can sometimes be seen in the QH effect when the current splits between multiple (evanescent) incompressible strips of different filling factors that are narrower than the Fermi wavelength [43], or when geometric effects lead to mixing of ρ xx into ρ yx [44]. The former case has no clear analog in QAH, where a single edge state is predicted.…”
Section: Quantization Of the Hall Resistancementioning
confidence: 92%
“…This confirms that the ultra-low step heights are beneficial for electronic transport [16,17] and ideal to electronic device applications. Taking into account that the Hall voltage drop occurs between the diagonally opposing corners of a Hall contact pair [44] one can calculate from the ρ xx values and the geometry of the contacts an upper limit [45] for the deviation from R K /2 of the Hall resistance (see methods). The upper limit was determined for each of the three pairs of directly opposing potential contacts ( figure 4(a)).…”
Section: Enhanced Buffer Layer Nucleation From Graphite Nanocrystalsmentioning
confidence: 99%