2014
DOI: 10.1016/j.egypro.2014.08.005
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A Generalized Electric Model for Mono and Polycrystalline Silicon in the Presence of Cracks and Random Defects

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Cited by 25 publications
(5 citation statements)
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“…Therefore, both categories can be classified as one type of crack. This result is different from the results explained in [7,8] because all the measured data in our experiments were taken from a real-time long-term environmental measurements instead of laboratory under controlled climate conditions. Based on the proposed statistical approach, the T-test values for all examined diagonal crack PV modules (12 PV modules) are shown in Table II.…”
Section: A Case Study 1 : Diagonal Crackcontrasting
confidence: 54%
See 1 more Smart Citation
“…Therefore, both categories can be classified as one type of crack. This result is different from the results explained in [7,8] because all the measured data in our experiments were taken from a real-time long-term environmental measurements instead of laboratory under controlled climate conditions. Based on the proposed statistical approach, the T-test values for all examined diagonal crack PV modules (12 PV modules) are shown in Table II.…”
Section: A Case Study 1 : Diagonal Crackcontrasting
confidence: 54%
“…The thermography technique is simpler to implement, but the accuracy of the image is lower than with the EL technique, and does not allow the estimation of the area (in mm 2 ) that is broken in the solar cells [7]. Therefore, the image technique used in this work is based on EL imaging method which also is illustrated and discussed briefly in the work of Berardone et al [8] and Spataru et al [9].…”
Section: Introductionmentioning
confidence: 99%
“…The thermography technique is simpler to implement, but the accuracy of the image is lower than with the EL technique, and does not allow the estimation of the area (in 2 mm) that is broken in the solar cells [12,13]. Therefore, in this paper we have used EL imaging method which can be illustrated and discussed briefly in the following literature [14][15][16].…”
mentioning
confidence: 99%
“…12b). Such cracks are very harmful, since their electric resistance may increase under the action of mechanical loading and degrade with time due to thermoelastic effects [21][22][23].…”
Section: F Advanced Diagnostic Techniquesmentioning
confidence: 99%