A general and robust analytical method for interface normal determination in TEM

Xie, Rui-Xun; Larranaga, Melvyn; Mompiou, Frédéric; Combe, Nicolas; Zhang, Wenzheng

doi:10.1016/j.ultramic.2020.113009

Cited by 3 publications

(6 citation statements)

References 16 publications

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“…A similar statistical treatment as performed above shows also that the average deviation angle between an erroneous set of data and a chosen plane normal is of the order of few degrees and decreases with increasing the number of data sets, with typical values of 1

^{\circ}

for six data sets 23 …”

Section: Methodsmentioning

confidence: 72%

“…A similar approach can be performed to determine direction or plane normal from a set of images. It is described in more details in 23 …”

Section: Methodsmentioning

confidence: 99%

“…These data constitute the set

({bold-italicb}_{normale}, η, w)

. If the surfaces are not parallel, the method can also be applied owing tracking a specific known point at the interface 23 …”

Section: Methodsmentioning

confidence: 99%

“…Analysing interface planes or dislocation slip planes also requires a lot of sample tilting. Though algorithms were developed, 21–23 not many software tools were reported on this purpose.

τ

ompas 15 offers a user‐friendly tool to identify the plane from its projections, but a priori guess of plane indices is still needed.…”

Section: Introductionmentioning

confidence: 99%

“…The tool diffraction proposes a new general algorithm to determine and refine the crystal orientation from a series of spot patterns recorded at arbitrary conditions. We recently proposed a general method to determine interface normal from a set of BF/DF images with a good accuracy 23 . This method, previously in command line form, is implemented in interface to perform graphical determination of lines or planes.…”

Section: Introductionmentioning

confidence: 99%

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pycotem: An open source toolbox for online crystal defect characterization from TEM imaging and diffraction

Mompiou

Xie

2020

Journal of Microscopy

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We present a series of tools working together that facilitate the determination of dislocation Burgers vectors and slip planes, interface plane normals and misorientation between two crystals from a series of Transmission Electron Microscopy (TEM) micrographs and diffraction patterns. To that purpose, we developed graphical user interface programs that allow crystal orientation determination from spot diffraction patterns taken at various tilt angles or from Kikuchi patterns crystal representation from stereographic projection plots and determination of geometrical features from series of conventional images taken at different tilt angles. We present working examples that allow a faster and easier way to analyse data that can especially be retrieved during in situ straining experiments where dislocations and grain boundaries need to be characterized. More generally, these tools target material scientists interested in daily microstructural characterization in TEM.

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^{\circ}

for six data sets 23 …”

Section: Methodsmentioning

confidence: 72%

“…A similar approach can be performed to determine direction or plane normal from a set of images. It is described in more details in 23 …”

Section: Methodsmentioning

confidence: 99%

“…These data constitute the set

({bold-italicb}_{normale}, η, w)

. If the surfaces are not parallel, the method can also be applied owing tracking a specific known point at the interface 23 …”

Section: Methodsmentioning

confidence: 99%

“…Analysing interface planes or dislocation slip planes also requires a lot of sample tilting. Though algorithms were developed, 21–23 not many software tools were reported on this purpose.