A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data

Kim, Sung Hoon; Novotný, David; Gordon, Joshua A.; Guerrieri, Jeffrey R.

doi:10.1109/tap.2016.2587745

Cited by 39 publications

(16 citation statements)

References 16 publications

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“…Various non‐resonance structures based on different transmission media and their measurement methods such as free‐space method [4–6], waveguide method [7, 8], coplanar waveguide (CPW) [9], transmission lines [10, 11], coaxial method [12, 13] and cylindrical capacitors [14, 15] have been developed over the last decades. Each of these methods has its advantages and disadvantages, especially for the measurement of engineered materials, which is usually small.…”

Section: Introductionmentioning

confidence: 99%

Analytical transmission line model for complex dielectric constant measurement of thin substrates using T‐resonator method

Zahedi

Boroumand

Aliakbrian

2020

IET Microwaves, Antennas & Propagation

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Section: Introductionmentioning

confidence: 99%

Analytical transmission line model for complex dielectric constant measurement of thin substrates using T‐resonator method

Zahedi

Boroumand

Aliakbrian

2020

IET Microwaves, Antennas & Propagation

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“…There are retrieval techniques available incorporating reflection coefficient data only. However, most of these techniques measure only complex permittivity while considering unity permeability as well as they require the prior knowledge of sample's thickness [28][29][30][31] In this paper, a novel free space frequency-timedomain technique has been proposed which employs only reflection coefficient data from the sample without the requirement of any complicated calibration procedure for determining the several dielectric properties (relative permittivity, relative permeability, thickness, attenuation constant, electrical conductivity, and losstangent) of the MUT. It does not require any prior knowledge of the thickness of the sample.…”

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A free space frequency‐time‐domain technique for electromagnetic characterization of materials using reflection‐based measurement

Aman

Singh²,

Nilotpal³

et al. 2020

Int J RF Microw Comput Aided Eng

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In this report, a free space frequency-time-domain technique is presented for characterizing the electrical properties and thickness of the sample using multiple reflections and fabry-perot resonance phenomenon. The retrieval of constitutive electromagnetic parameters of the sample has been carried out by comparing the measured reflection coefficient data from the sample at two different incident angles. The relative permittivity as well as relative permeability along with the thickness of different samples viz., beryllia, silicon, and plexiglass have been evaluated with high accuracy in the frequency range 1 to 15 GHz. The method is also experimentally validated by successfully reconstructing the unknown material properties of two different samples. The unique advantage of this method lies in non-requirement of any prior knowledge of the sample's thickness for measuring the complex relative dielectric constant as well as relative permeability of the sample. To determine the electromagnetic properties of the sample, the sole knowledge of reflection coefficient data are needed. Moreover, the method does not involve any additional measurement for the reference calibration. The simple, cost-effective proposed scheme is quite useful in many applications like accurate determination of signal strength in indoor wireless communication, through wall imaging, food industry, and so on.

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“…At higher frequencies, several free-space systems for dielectric characterization have been demonstrated, operating in the V-band from 40 GHz to 90 GHz [12], W-band from 75 GHz to 110 GHz [13]–[17], from 30 GHz to 250 GHz in [18], and from 18–760 GHz in [19]. Recently, the frequency range from 220 GHz to 330 GHZ has received rising interest [20]–[21]. Tosaka et al tested both a time-domain spectroscopy (TDS) system and a vector network analyzer (VNA) system, to reconstruct the dielectric permittivity of unknown materials, in the same frequency band of 220 GHz to 330 GHz [20].…”

Section: Introductionmentioning

confidence: 99%

“…Both systems were found to yield comparable results and the advantages and limitations of each system were highlighted [20]. Kim et al also implemented a 220 GHz to 330 GHz free-space measurement system that can reconstruct the dielectric permittivity of unknown dielectrics without the prior knowledge of the dielectric thickness [21]. Free-space terahertz characterization of multi-walled CNT (MWCNT) papers, in the frequency range 50 GHz – 370 GHz, was also reported in [22].…”

Section: Introductionmentioning

confidence: 99%

A $Q$ -Band Free-Space Characterization of Carbon Nanotube Composites

Hassan

Obrzut

Garboczi

2016

IEEE Trans. Microwave Theory Techn.

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We present a free-space measurement technique for non-destructive non-contact electrical and dielectric characterization of nano-carbon composites in the Q-band frequency range of 30 GHz to 50 GHz. The experimental system and error correction model accurately reconstruct the conductivity of composite materials that are either thicker than the wave penetration depth, and therefore exhibit negligible microwave transmission (less than −40 dB), or thinner than the wave penetration depth and, therefore, exhibit significant microwave transmission. This error correction model implements a fixed wave propagation distance between antennas and corrects the complex scattering parameters of the specimen from two references, an air slab having geometrical propagation length equal to that of the specimen under test, and a metallic conductor, such as an aluminum plate. Experimental results were validated by reconstructing the relative dielectric permittivity of known dielectric materials and then used to determine the conductivity of nano-carbon composite laminates. This error correction model can simplify routine characterization of thin conducting laminates to just one measurement of scattering parameters, making the method attractive for research, development, and for quality control in the manufacturing environment.

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A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data

Cited by 39 publications

References 16 publications

Analytical transmission line model for complex dielectric constant measurement of thin substrates using T‐resonator method

Analytical transmission line model for complex dielectric constant measurement of thin substrates using T‐resonator method

A free space frequency‐time‐domain technique for electromagnetic characterization of materials using reflection‐based measurement

A $Q$ -Band Free-Space Characterization of Carbon Nanotube Composites

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