Abstract:Current memory testing methods rely on fault models that are inadequate to accurately represent potential defects that occur in modern, often specialized, memories. To remedy this, the authors present a formal framework for modeling and testing special-purpose memories. Their approach uses three models: the transistor circuit, the event-sequence model, and finite-state machines. The methodology is explained using the example of a content-addressable memory (CAM). The fault model they describe comprises input s… Show more
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