Handbook of Near-Infrared Analysis 2021
DOI: 10.1201/b22513-23
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A Framework for Representative Sampling for NIR Analysis – Theory of Sampling (TOS)

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“…This oftenoverlooked sampling duality is treated in more detail in. [2][3][4][5][6][7] The universal objective of proper sampling is how to counteract adverse influences from material heterogeneity on the primary sampling (or sensor signal acquisition), subsampling, and sample preparation/presentation processes. The Theory and Practice of Sampling is the only comprehensive theoretical and practical framework with which to eliminate or reduce maximally, the adverse Total Sampling Error (TSE) effects on Measurement Uncertainty (MU total ).…”
Section: The Minimum Tos Responsibility For Nir Analystsmentioning
confidence: 99%
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“…This oftenoverlooked sampling duality is treated in more detail in. [2][3][4][5][6][7] The universal objective of proper sampling is how to counteract adverse influences from material heterogeneity on the primary sampling (or sensor signal acquisition), subsampling, and sample preparation/presentation processes. The Theory and Practice of Sampling is the only comprehensive theoretical and practical framework with which to eliminate or reduce maximally, the adverse Total Sampling Error (TSE) effects on Measurement Uncertainty (MU total ).…”
Section: The Minimum Tos Responsibility For Nir Analystsmentioning
confidence: 99%
“…A much overlooked duality: governing principles (GP), potential sampling errors (SE) and Sampling Unit Operations (SUO) are identical for physical sampling (left) and for sensor signal acquisition, "PAT sampling" (right). The TOS framework is intended to be applied identically to both stationary lots and for moving lots, see [2][3][4][5][6][7] for full treatment. Illustration copyright by KHE Consulting, reproduced with permission.…”
Section: The Replication Experiments (Re)mentioning
confidence: 99%
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