A framework for reliability modeling of electronics

Evans, John W.; Lall, Pradeep; Bauernschub, R.

doi:10.1109/rams.1995.513238

Cited by 11 publications

(3 citation statements)

References 3 publications

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“…The physics-of-failure approach is implemented in Computer Aided Design of Microelectronics Packages (CADMP) [36], [37] software. CADMP, developed by CALCE, can improve assessment of component reliability at the design phase, the development of science-based tests, assessment of packages designed by different manufacturers, and cost-effective product development.…”

Section: B Physics-of-failure Modelmentioning

confidence: 99%

Electronic System Reliability: Collating Prediction Models

Goel

Graves

2006

IEEE Trans. Device Mater. Relib.

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This paper summarizes research done in the area of electronic system reliability and assesses the approaches used in the calculation of electronic system failure rates. A detailed literature survey is conducted to investigate the various available reliability prediction models.The paper starts with a definition of reliability, briefly discusses various regions of system failure rate in time, justifies the role of reliability prediction methods, provides a historical overview, classifies the traditional models into easy to understand categories and discusses the advantages and disadvantage, reviews the key models that are currently in use, and compares the first and most widely used model (i.e., MIL-HDBK-217) with the most recently introduced model (i.e., PRISM).Index Terms-Electronic component reliability, empiricalbased models, failure rate, MIL-HDBK-217, physics-of-failure, prediction models.

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Section: B Physics-of-failure Modelmentioning

confidence: 99%

Electronic System Reliability: Collating Prediction Models

Goel

Graves

2006

IEEE Trans. Device Mater. Relib.

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“…A notable discrepancy exists in the literature between the definitions of failure mode and failure mechanism. In some publications, the physical processes that lead to failure are termed failure mechanisms, and the effects of those failure mechanisms are termed failure modes [1,2,12,15]. In spite of these plausible definitions of failure mechanism and failure mode, the widely accepted Failure Modes and Effects Analysis (FMEA) involves the investigation and assessment of the effects of possible failure modes on a system, and the effects of electrical failure modes are identified as shorts and open circuits [6].…”

Section: Failure Modementioning

confidence: 99%

“…Alpha particle induced soft errors [15,17,21] occur when a sufficient number of the minority carriers generated by an alpha particle or a cosmic ray are collected on a storage node to pull the node from logic high to logic low thereby destroying the memory state. Alpha particles can be produced by cosmic rays or the radioactive decay of uranium and thorium impurities incorporated in IC packaging materials.…”

Section: Failure Modes Identified As a Form Of Noisementioning

confidence: 99%

Failure Analysis in Subsystem Design for Space Missions

Uder

Stone

Tumer

2004

Volume 3a: 16th International Conference on Design Theory and Methodology

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We supplement previous efforts toward describing a standardized vocabulary for mechanical failures by presenting the current state of an electromechanical failure mode taxonomy. Failure is defined in terms of the cause of the failure mode, the failure mode, and the effect of the failure mode that renders an electrical, mechanical or electromechanical device incapable of satisfactorily performing its intended function under normal usage conditions. We utilize an elemental physics of failure approach to define failure mode and then use this definition and literature review to develop the electrical failure modes presented in the taxonomy. The list of proposed electrical failure modes is tested against a set of NASA problem reports before being revised to include additional failure modes encountered in space applications. The resulting taxonomy is summarized in the form of 38 electrical failure modes organized into 13 categories. The final version of the electromechanical failure mode taxonomy will be combined with a functional modeling approach to predict potential failures during the conceptual stages of design.

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