1969
DOI: 10.6028/nbs.tn.479
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A Fortran program for analysis of ellipsometer measurements

Abstract: A general Fortran program is given that performs the calculations required to analyze ellipsometer measurements. This program replaces the program given in NBS Technical Note 242, entitled "A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of Reflection Coefficients From Thin Films." The main changes from the previous program are: 1) the new program is in Fortran IV and V rather than Fortran II; 2) the relative transmission of the wave plate is considered in analyzing ellipsometer rea… Show more

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Cited by 119 publications
(72 citation statements)
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“…The Auto-Ell III ellipsometer (Rudolph Research, Fairfield, NJ, USA) was programmed for measurements on silicon, and this option was used. The protein film thickness was calculated according to the McCrackin evaluation algorithm [32] and the adsorbed amount per unit area calculated by De Feijter's formula [33]. The refractive indices used were 1.335 and 1.465 for the buffer and the adsorbed APTES and proteins, respectively [34,35].…”
Section: Ellipsometrymentioning
confidence: 99%
“…The Auto-Ell III ellipsometer (Rudolph Research, Fairfield, NJ, USA) was programmed for measurements on silicon, and this option was used. The protein film thickness was calculated according to the McCrackin evaluation algorithm [32] and the adsorbed amount per unit area calculated by De Feijter's formula [33]. The refractive indices used were 1.335 and 1.465 for the buffer and the adsorbed APTES and proteins, respectively [34,35].…”
Section: Ellipsometrymentioning
confidence: 99%
“…The average thicknesses of the adsorbed layers were calculated according to the McCrackin algorithm [24]. The average adsorbed mass per unit area was calculated according to deFeijter [25] using dn/dc = 0.169 cm 3 /g, and a layer of 1 nm thickness then corresponded to approximately 70 ng/cm 2 .…”
Section: In Situ Null Ellipsometrymentioning
confidence: 99%
“…Protein adsorption on Si was measured with NE in air and thickness values were calculated with the McCrackin algorithm [26]. Here n p =1.457, which equals the refractive index of SiO 2 at 633 nm, was used to facilitate determination of using a method developed by Stenberg et al [27].…”
Section: Fig 2 Schematic Model (Left) and Optical Model (Right) Usementioning
confidence: 99%
“…The measurements were performed with NE in situ in veronal buffered saline supplemented with 0.15 mM CaCl 2 and 0.5 mM MgCl 2 (VB ++ ). The adsorbed protein layer thicknesses were calculated with the McCrackin algorithm [26] using n a = 1.335 and n p = 1.465 [28]. The surface mass density, Γ, was calculated using de Feijter's formula with n p =1.465 and dn/dc=0.18 cm 3 /g.…”
Section: Procedures For Blood Plasma Incubation Using Nementioning
confidence: 99%