A fine structure of parametric X-ray radiation from relativistic electrons in a crystal

Shchagin, A. V.; Pristupa, V.I.; Khizhnyak, N.A.

doi:10.1016/0375-9601(90)90504-h

Cited by 93 publications

(46 citation statements)

References 5 publications

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“…Experimental studies of PXR from beams with energies from 25 to 900 MeV interacting with several types of single crystals have generally verified the predicted angular distribution, bandwidth, and polarization of PXR [12][13][14][15][16][17][18].…”

mentioning

confidence: 91%

Observation of higher order parametric x-ray spectra in mosaic graphite and single silicon crystals

et al. 1993

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mentioning

confidence: 91%

Observation of higher order parametric x-ray spectra in mosaic graphite and single silicon crystals

et al. 1993

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“…The theoretical description of the intensity distribution of PXR [51,52,45,53,54], suitably modified for self-absorption and multiple-scattering effects, has been tested for a broad range of electron energies extending from 3.5 MeV [55,56] to about 1 GeV [46]. It was found to be accurate within 12%.…”

Section: Parametric X-radiationmentioning

confidence: 99%

Coherent X-rays at MAMI

et al. 2006

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Abstract. Coherent radiation in the range from soft X-rays up to hard X-rays, produced by the lowemittance electron beam of MAMI, can be used for various applications. Novel types of interferometers have been developed for the measurement of the complex index of refraction of thin self-supporting foils. For the vacuum ultraviolet and soft X-ray region the interferometer consists of two collinear undulators, and a grating spectrometer. A foil placed between the undulators causes a phase shift and an attenuation of the oscillation amplitude. The complex index of refraction has been measured at the L 2,3-absorption edges of nickel. A novel method is described for the measurement of the X-ray magnetic circular birefringence. For the hard X-ray region the interferometer consists of two foils at which the 855 MeV electron beam produces transition radiation. Distinct interference oscillations have been observed as a function of both, the photon emission angle and the distance between the foils. The refractive index decrement δ(ω) of a 2 µm thick nickel sample foil has been measured at X-ray energies around the K absorption edge at 8333 eV and at 9930 eV with an accuracy of better than 1.5 %. The line width of parametric X radiation (PXR) was measured in backward geometry with a Si single-crystal monochromator. Upper limits of the line width of 42 meV, 50 meV, and 44 meV, have been determined for the (333), (444) and (555) reflections at photon energies of 5932 eV, 7909 eV, and 9887 eV, respectively. Small angle scattering of the electrons in the crystal leads to a stochastic frequency modulation of the exponentially damped wave train which results in the line broadening. To elucidate the quest if the production of PXR is a kinematical or a dynamical process the radiation from silicon single-crystal targets, emitted close to the electron direction, has been studied. The observed interference structures and the narrow-band radiation in forward direction shows that PXR is produced in a dynamical process. .Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) -41.60.-m Radiation by moving charges -41.50.+h X-ray beams and X-ray optics PACS.

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“…The effect of channeling was not taken into account in the present estimations of CXR yield, as it is not expected to be very significant at high particle energies (see Refs. in [22]). …”

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confidence: 98%

“…[22]. In the calculations, the K-shell ionization cross section for Si atoms was taken to be 1943 barn.…”

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confidence: 99%

Focusing of parametric X-ray radiation

Shchagin

2004

Jetp Lett.

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An idea of producing a focused parametric X-ray radiation (PXR) is presented. The PXR is emitted by relativistic charged particles channeling along a bent crystal. Then the PXR emitted from the whole length of the bent crystal is going to the focus. Some properties of focused PXR are estimated for typical experimental conditions and possible applications are discussed. The experiment for observation of focused PXR is proposed. 61.80.Cb, 61.85.+p, 41.50.+h

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A fine structure of parametric X-ray radiation from relativistic electrons in a crystal

Cited by 93 publications

References 5 publications

Observation of higher order parametric x-ray spectra in mosaic graphite and single silicon crystals

Observation of higher order parametric x-ray spectra in mosaic graphite and single silicon crystals

Coherent X-rays at MAMI

Focusing of parametric X-ray radiation

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