2013
DOI: 10.1109/jphotov.2013.2270348
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A Fill Factor Loss Analysis Method for Silicon Wafer Solar Cells

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Cited by 124 publications
(69 citation statements)
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“…Following an approach similar to [34], by considering the difference between F F s and measured FF (from illuminated I-V measurements), we can estimate the magnitude of FF losses due to recombination currents following ideality factors n different from 1: ΔFF_J(n = 1) = F F s -FF (see Fig. 5).…”
Section: B Fill-factor Losses: Interdigitated Back-contacted Siliconmentioning
confidence: 99%
“…Following an approach similar to [34], by considering the difference between F F s and measured FF (from illuminated I-V measurements), we can estimate the magnitude of FF losses due to recombination currents following ideality factors n different from 1: ΔFF_J(n = 1) = F F s -FF (see Fig. 5).…”
Section: B Fill-factor Losses: Interdigitated Back-contacted Siliconmentioning
confidence: 99%
“…Finally, as both constants a and b can be exclusively expressed in relation to the third one, f, Equation (7) can be expressed in terms of the characteristic points of the I-V curve: (13) Consequently, an expression for the solar cell/panel behavior in the first bracket, which is only dependent on I-V curve characteristic points is obtained.…”
Section: Equations Proposedmentioning
confidence: 99%
“…The equivalent circuit parameter extraction process is not an immediate task, and even doing it by analytical methods it requires a quite large number of calculations [1,2]. Some efforts have been made in order to ease the parameter extraction procedure, the use of a reduced number of points of the I-V curve being an interesting methodology [9][10][11], together with the use of expressions based on the fill factor [12][13][14], In the present paper, a new simple mathematical method to approach the behavior of a photovoltaic device is proposed as an alternative to the equivalent circuit models. In some applications a very quick and easy approach to a solar cell/panel behavior is required.…”
Section: Introductionmentioning
confidence: 99%
“…5c. FFJ 01 was evaluated from the V oc at 1-sun using the exact analytical solution of reference [24]. circuit voltage at one sun using the (exact) analytical method described in Ref.…”
Section: Influence Of Surface Passivation On Pn-junction Recombinationmentioning
confidence: 99%
“…circuit voltage at one sun using the (exact) analytical method described in Ref. [24]. Lines are guides for the eye.…”
Section: Influence Of Surface Passivation On Pn-junction Recombinationmentioning
confidence: 99%