1970
DOI: 10.1111/j.1365-2478.1970.tb02129.x
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A Fast Method for Determining the Layer Distribution From the Raised Kernel Function in Geoelegtrical Sounding*

Abstract: In a previous publication (Koefoed 1968) a function called the “raised kernel function” has been introduced as an intermediate function in the interpretation of resistivity sounding data, and methods have been described both for the determination of the raised kernel function from the apparent resistivity function, and for the determination of the layer distribution from the raised kernel function. In the present paper a procedure is described by which the second step in this interpretation method–i.e. the det… Show more

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Cited by 74 publications
(47 citation statements)
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“…layer thickness, layer true resistivity) can be expressed by an integral equation considering an earth model consisting of homogeneous and isotropic layers. Following (Koefoed, 1970) we write the equation as follows…”
Section: Forward Modelingmentioning
confidence: 99%
See 1 more Smart Citation
“…layer thickness, layer true resistivity) can be expressed by an integral equation considering an earth model consisting of homogeneous and isotropic layers. Following (Koefoed, 1970) we write the equation as follows…”
Section: Forward Modelingmentioning
confidence: 99%
“…Following Koefoed (1970) we write recurrence relationship of the resistivity transform function, T (λ) as,…”
Section: Forward Modelingmentioning
confidence: 99%
“…Here, J 1 (λs) is the first order Bessel function of first kind, T (ρ i , d i ; λ) is the electrical impedance at the surface -defined as the resistivity transform function (Koefoed, 1970) of layer resistivities and thicknesses and λ is the integration variable. On the basis of the above discussion we can write the corresponding expression of apparent chargeability-resistivity for Schlumberger configuration as…”
Section: Theoretical Considerationsmentioning
confidence: 99%
“…Furthermore, a distortion over a small segment of the VES curve will cause a distortion over a correspondingly larger segment on the transformed TKF curve. Koefoed (1965Koefoed ( , 1966Koefoed ( , 1968) used the raised kernel function H(\) instead of the Stefanesco kernel function 9(A) and subsequently (Koefoed, 1970) introduced graphs to accelerate the evaluation of the layer thicknesses and resistivities from the raised kernel function H(X). Other students of the direct interpretation of resistivity data in the kernel domain include Crous (1971), Meinardus (1967Meinardus ( , 1970, Onodera (1960), Pekeris (1940), andVozoff (1958).…”
Section: '0mentioning
confidence: 99%