A Fast Dejittering Approach for Line Scanning Microscopy

Abstract

We propose two efficient optimization approaches to correct jitter effects appearing in a specific type of line scanning microscopy. In this modality, even lines suffer from a non uniform and non integer distortion with respect to odd lines, creating significant visual artifacts. The huge image size make this problem highly challenging. To handle it, we propose two techniques. One is based on dynamic programming and has a complexity linear w.r.t. the number of pixels. The second is based on a convex relaxation and can be particularly efficient for parallel architectures. Both algorithms provide globally optimal solutions. The empirical reconstruction results are of high quality.