A failure mechanism consistency test method for accelerated degradation test

Abstract

Accelerated degradation test (ADT) is generally used to accelerate degradation processes in products to estimate their lifespan and to assess their reliability in a short period of time. How to perform the failure mechanism consistency test is crucial in the application of the ADT method. Existing failure mechanism consistency test methods assume that degradation rates among individual products are the same. However, these methods do not take degradation dispersions caused by manufacturing technologies into consideration. To address this issue, a failure mechanism consistency test method for ADT based on the activation energy invariant method and the likelihood ratio test is proposed. First, a degradation modeling method for ADT is introduced. Then, the logarithmic maximum likelihood function values of the degradation models are estimated based on the two‐step maximum likelihood estimation (MLE) method. Finally, the decision rule is proposed based on the likelihood ratio test. The method mentioned above is, then, used on the real degradation data of carbon‐film resistors and bullet O‐rings, and its effectiveness is verified. Furthermore, based on the failure mechanism change point in RTV5370 siloxane rubbers, the simulated degradation data are degenerated to compare the proposed method with the method not considering individual differences in different ADT programs and degradation dispersions.

A literature review on the planning and analysis of accelerated degradation testing for mechanical products

“…Then, an estimate of the reliability and life parameters of products under normal working stress levels will be obtained by establishing an acceleration model and using performance degradation data under high stress to extrapolate reasonably [7]. ADT is a significant manner for solving the life prediction problem of products with complex failure mechanisms and changing environments, contributing to obtaining product life and reliability indicators with less time cost and higher estimation accuracy [8].…”

Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process

“…Wang et al [18] Provided an optimal SSADT plan for the IG degradation process under the constraint of the total experimental budget by minimizing the asymptotic variance of the estimated p-quantile of the lifetime distribution of the product. Further applications of SSADT can be found in [19][20].…”

A Novel Model Validation Method Based on Area Metric Disagreement between Accelerated Storage Distributions and Natural Storage Data

“…Cai et al [17] proposed a change-point model for the coefficients of variation to fit the abrupt change behavior of the failure mechanisms with a nonparametric empirical likelihood approach, which was used in the lifetime data of the metal oxide semiconductor transistors in the power distribution system of the Chinese Tiangong space station. Zhai et al [18] proposed a method for consistency testing of ADT (accelerated degradation test) failure mechanisms based on the activation energy invariance method and the likelihood ratio test, accounting for the degradation dispersion caused by the manufacturing technology.…”