This study evaluates the junction-tip coordinates and the stress intensity factors (SIFs) of multi-material junctions using the image-correlation experiment and least-squares method. The major advantage of the proposed method is that the procedure is simple and systematic. First, complex displacement functions are deduced into a least-squares form, and then displacement fields from the image-correlation experiment are substituted into the least-squares equation to evaluate the SIFs. Compared with the SIFs from H-integrals using finite element results, the calculated least-squares SIFs are accurate if more than 10 eigenvalues are included. Furthermore, the leastsquares SIFs are not sensitive to the maximum or minimum radius of the area from which data is included.