A dV/dt noise canceling circuit of capacitive-isolated gate drivers

Abstract

For capacitive-isolated gate drivers, the pulse width distortion (PWD) and common mode transient immunity (CMTI) are vital factors to evaluate its performance. In this paper, an envelope detection circuit and a dV/dt noise canceling circuit of capacitive-isolated gate drivers is designed based on X-FAB 0.35μm CMOS process. With these structures, this gate driver alleviates PWD and improve CMTI. Spectre simulation results show that the gate driver achieves 200kV/μs CMTI with 50ns propagation delay and maximum 7.4ns PWD. Besides, it has better robustness to fabrication process and temperature variation than conventional methods.