A dual-function ESPI system for the measurement of out-of-plane displacement and slope

Digital speckle pattern interferometry (DSPI) is a tool for making qualitative as well as quantitative measurements of deformation of objects. Temporal and spatial phase shifting techniques have been introduced in DSPI for extracting quantitative deformation data from the system. Temporal phase-shifting technique requires at least three phase shifted intensity patterns for phase measurement. On the other hand, spatial phase shifting technique though require single frame before and after the object deformation, gives low spatial resolution result. In this paper we propose a temporal phase shifting technique that uses only two phase shifted speckle patterns before and after the object deformation by suppressing the dc-term from the intensity pattern either by an averaging technique in spatial domain or low-pass filter operation in the frequency domain. Both the simulation and experimental results are presented to validate the effectiveness of the proposed technique.

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“…16. The test specimen used in this study is an Aluminum circular plate with a diffuse surface and a fully clamped boundary.…”

Section: Resultsmentioning

confidence: 99%

Two-step dc-term-suppressed phase shifting technique in DSPI

2009

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“…It is well known that when an object is illuminated by a single collimated beam, the relationship between the phase difference and the change in displacement [Rastogi, 1996;Ng , 1995;Bhaduri, 2006] is obtained from:…”

Section: Slope Measurements Of a Phase Objectmentioning

confidence: 99%

Simultaneous Phase Shifting Shearing Interferometry for Measurement of Static and Dynamic Phase Objects

Toto-Arellano¹,

Serrano-García²,

Martínez-García³

et al. 2012

Interferometry - Research and Applications in Science and Technology

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“…Electronic speckle pattern interferometry ESPI [1][2][3][4] Carrier-wave electronic speckle pattern interferometry CESPI [5][6][7] A.…”

Section: Imentioning

confidence: 99%

Study on the carrier frequency of Carrier-wave electronic speckle pattern interferometry

Lin

2011

2011 International Conference on Electric Information and Control Engineering

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The choice of carrier frequency choice for Carrierwave electronic speckle pattern interferometry (CESPI) is one of the key factors which affect the quality of carrier correlation fringe images and the result of measuring. Through researching systematically the carrier frequency requests of the spectral separation and measurement sensitivity, the rules of carrier frequency choice were generalized. According to the rules, an improved spatial modulation method which was based on deflection of reference mirror was proposed. The modulation principle theory was analyzed by setting up a geometric optical model. The results of examples showed that the modulation method could overcome the shortage that the speckle size limited carrier frequency. It could increase the carrier frequency effectively that was propitious to scrub out the carrier frequency spectrum part including shape change information from the low frequency part including background information. The modulation method is particularly applicable to measure out-of plane displacement caused by big-load with high precision.

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A dual-function ESPI system for the measurement of out-of-plane displacement and slope

Cited by 32 publications

References 18 publications

Two-step dc-term-suppressed phase shifting technique in DSPI

Two-step dc-term-suppressed phase shifting technique in DSPI

Simultaneous Phase Shifting Shearing Interferometry for Measurement of Static and Dynamic Phase Objects

Study on the carrier frequency of Carrier-wave electronic speckle pattern interferometry

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