A double-pass interferometer for measurement of dimensional changes

Ren, Dongmei; Lawton, Kevin M.; Miller, Jimmie A.

doi:10.1088/0957-0233/19/2/025303

Cited by 9 publications

(9 citation statements)

References 14 publications

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“…The linear operator h i is a 16×16 matrix, the elements of which are detailed in Eqs. (10) and (11) in Appendix A. The calibrated PSG matrix w is then the non-zero solution to Eq.…”

Section: Step 1: Determining the Properties Of Calibration Samplesmentioning

confidence: 99%

“…Inherited from standard interferometry [9], the double-pass configuration detecting the phase shift between its two arms has been developed for sensing applications such as dilatometric measurement [10] and pH monitoring [11]. In polarimetry, a doublepass layout enables angle-resolved measurements, whereby the polarization response of a sample for a range of polar angles and all azimuths can be measured in a synchronous approach.…”

Section: Introductionmentioning

confidence: 99%

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Tolerance analysis of non-depolarizing double-pass polarimetry

Baba-Ali

Gallatin

2020

PhotoniX

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Double-pass polarimetry measures the polarization properties of a sample over a range of polar angles and all azimuths. Here, we present a tolerance analysis of all the optical elements in both the calibration and measurement procedures to predict the sensitivities of the double-pass polarimeter. The calibration procedure is described by a Mueller matrix based on the eigenvalue calibration method (ECM) [1]. Our numerical results from the calibration and measurement in the Mueller matrix description with tolerances limited by systematic and stochastic noise from specifications of commercially available hardware components are in good agreement with previous experimental observations. Furthermore, by using the orientation Zernike polynomials (OZP) which are an extension of the Jones matrix formalism, similar to the Zernike polynomials wavefront expansion, the pupil distribution of the polarization properties of non-depolarizing samples under test are expanded. Using polar angles ranging up to 25°, we predict a sensitivity of 0.5% for diattenuation and 0.3°for retardance using the root mean square (RMS) of the corresponding OZP coefficients as a measure of the error. This numerical tool provides an approach for further improving the sensitivities of polarimeters via error budgeting and replacing sensitive components with those having better precision.

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“…The linear operator h i is a 16×16 matrix, the elements of which are detailed in Eqs. (10) and (11) in Appendix A. The calibrated PSG matrix w is then the non-zero solution to Eq.…”

Section: Step 1: Determining the Properties Of Calibration Samplesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Tolerance analysis of non-depolarizing double-pass polarimetry

Baba-Ali

Gallatin

2020

PhotoniX

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“…The initial interferometer analyzed is based on a double-pass dilatometer design by Ren et al [12]. This interferometer has been modified, which is shown in Fig.…”

Section: Double-pass Interferometermentioning

confidence: 99%

Balanced interferometric system for stability measurements

et al. 2009

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We describe two different, double-sided interferometer designs for measuring material stability. Both designs are balanced interferometers where the only optical path difference is the sample and the reference beams are located within the interferometer. One interferometer is a double-pass design, whereas the other is a single-pass system. Based on a tolerancing analysis, the single-pass system is less susceptible to initial component misalignment and motions during experiments. This single-pass interferometer was tested with an 86 nm thin-film silver sample for both short-term repeatability and long-term stability. In 66 repeatability tests of 30 min each, the mean measured drift rate was less than 1 pm=h rms. In two long-term tests (>9 h), the mean drift rate was less than 1:1 pm=h, which shows good agreement between the short-and long-term measurements. In these experiments, the mean measured length change was 2 nm rms.

show abstract

“…Inherited from standard interferometry [9], the doublepass configuration detecting the phase shift between its two arms has been developed for sensing applications such as dilatometric measurement [10] and pH monitoring [11]. In polarimetry, a double-pass layout enables angle-resolved measurements, whereby the polarization response of a sample for a range of polar angles and all azimuths can be measured in a synchronous approach.…”

Section: Introductionmentioning

confidence: 99%

Tolerance analysis of non-depolarizing double-pass polarimetry

Yu,

Baba-Ali,

Gallatin

2020

Preprint

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Double-pass polarimetry measures the polarization properties of a sample over a range of polar angles and all azimuths. Here, we present a tolerance analysis of all the optical elements in both the calibration and measurement procedures to predict the sensitivities of the double-pass polarimeter. The calibration procedure is described by a Mueller matrix based on the eigenvalue calibration method (ECM) [1]. Our numerical results from the calibration and measurement in the Mueller matrix description with tolerances limited by systematic and stochastic noise from specifications of commercially available hardware components are in good agreement with previous experimental observations. Furthermore, by using the orientation Zernike polynomials (OZP) which are an extension of the Jones matrix formalism, similar to the Zernike polynomials wavefront expansion, the pupil distribution of the polarization properties of non-depolarizing samples under test are expanded. Using polar angles ranging up to 25 • , we predict a sensitivity of 0.5% for diattenuation and 0.3 • for retardance using the root mean square (RMS) of the corresponding OZP coefficients as a measure of the error. This numerical tool provides an approach for further improving the sensitivities of polarimeters via error budgeting and replacing sensitive components with those having better precision.

show abstract

A double-pass interferometer for measurement of dimensional changes

Cited by 9 publications

References 14 publications

Tolerance analysis of non-depolarizing double-pass polarimetry

Tolerance analysis of non-depolarizing double-pass polarimetry

Balanced interferometric system for stability measurements

Tolerance analysis of non-depolarizing double-pass polarimetry

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