2020
DOI: 10.48550/arxiv.2008.04075
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A direct interferometric test of the nonlinear phase shift gate

Peter L. Kaulfuss,
Paul M. Alsing,
Edwin E. Hach
et al.

Abstract: We propose a direct interferometric test of the Non-Linear Phase Shift Gate (NLPSG), an essential piece of a Knill Laflamme Milburn Contolled-NOT (KLM CNOT) gate. We develop our analysis for the both the case of the original, bulk optical KLM NLPSG and for the scalable integrated nano-photonic NLPSG based on Micro-Ring Resonators (MRRs) that we have proposed very recently. Specifically, we consider the interference between the target photon mode of the NLPSG along one arm of a Mach Zehnder Interferometer (MZI)… Show more

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