A direct calibration method for line structured light measurement system based on parallel lines

Wang, Zhaoxu; Fu, Yanjun; Zhong, Kangping; Li, Ye; Bao, Wei

doi:10.1016/j.optcom.2021.127699

Cited by 8 publications

(3 citation statements)

References 14 publications

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“…Three-dimension measurement technique based on line laser has been widely used in practical industrial scenarios [1][2][3][4]. Accurate calibration results of camera parameters and light plane equation of line-structured light (LSL) are the vital basis for high precision 3D measurement [5].…”

Section: Related Workmentioning

confidence: 99%

A calibration method for line-structured light using mirror-based virtual binocular vision system

Yang

Zhang

et al. 2023

Meas. Sci. Technol.

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A calibration method for line-structured light (LSL) by using a virtual binocular vision system (VBVS) composed of one camera and a front coating plane mirror is promoted in this work. The front coating plane in the VBVS can generate much less coplanarity error in lithographic feature points and remarkably decline the imaging distortion during back coating. An encoded target is proposed to distinguish between real corners and virtual corners (mirrored corners) and achieve high-precision matching between real and virtual corners when the target is occluded during the VBVS calibration. A parameter optimization method based on 3D constraints is presented in the work to obtain accurate structural parameters and thus guarantee precise reconstruction of the LSL. Moreover, the laser stripe and its mirrored image meet the auto-epipolar constraint. Therefore, the matching between the real and virtual stripes can be realized based on the vanish point. The performance of our method is verified in the experiments.

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Section: Related Workmentioning

confidence: 99%

A calibration method for line-structured light using mirror-based virtual binocular vision system

Yang

Zhang

et al. 2023

Meas. Sci. Technol.

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“…Diffraction gratings are key optical components extensively used in fields like spectroscopy, telecommunications, astronomy, laser systems, and metrology [1][2][3][4][5]. The integration of gratings and other passive optical elements within the bulk of a material has unlocked new potential, expanding the capabilities and applications of these technologies in various domains.…”

Section: Introductionmentioning

confidence: 99%

Multilevel diffraction gratings inside silicon towards spectral filtering

Bütün,

Saylan,

Sabet

et al. 2024

Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXIX

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Silicon-based integrated photonics holds the promise of revolutionizing key technologies, such as telecommunications, computing, and lab-on-chip systems. One can achieve diverse functionalities in two ways: on the wafer surface ("on-chip") or within its bulk ("in-chip"), the latter gaining recognition due to recent advancements in laser lithography. Until recently, 3D in-chip laser writing has only been utilized for single-level devices, leaving a vast potential for monolithic and multilevel functionality within silicon untapped. In our previous research, we successfully designed and fabricated multilevel, high-efficiency diffraction gratings in silicon using nanosecond laser pulses. Their high performance stemmed from effective field enhancement at Talbot self-imaging planes. Our current work takes a theoretical approach, investigating how varying the grating period affects the performance of in-chip multilevel gratings. We demonstrate that the previously achieved 95% diffraction efficiency at a 1550 nm wavelength is also attainable with a reduced period of 3 μm. This smaller period is predicted to allow for spectral filtering, nearly equivalent to commercially available filters in terms of full width at half maximum (FWHM). Our findings underscore the potential of volumetric Si photonics and mark a significant step towards realizing 3D-integrated monolithic chips.

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“…Structured light measurement technology has advantages such as simple installation, high accuracy, speed, and low cost. It has become a noncontact, three-dimensional pose or metrology measurement technology that researchers are devoted to researching and has made outstanding contributions [12][13][14]. Wan et al [14] created the new forms of ultra-DOF structured light, which exhibited their power in increasing information capacity and safety.…”

mentioning

confidence: 99%

Optimization and accuracy analysis in pose measurement of the subreflectors of large antennas based on stereo structured light

Zhang,

Lin,

Wang

et al. 2024

Front. Phys.

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The accuracy of the pointing error in the subreflector is of great importance to the large steerable radio telescope, so the measurement of the six degree-of-freedom (DOF) poses of the subreflector is crucial, which are measured by the detector and the laser array. The errors in the pose measurement system of the subreflector contain random measure errors and fitting iteration errors; all of them will add up to the pose measurement, which affects the accuracy of the six DOF parameters. This paper proposed the accuracy analysis method in the pose measurement of the subreflector of large antennas, which includes the error in the variable model in laser three-dimensional point space linear fitting, iterative accuracy analysis of spatial equations in Newton’s downhill method, and the analysis of the adjustment theory of the Bursa model. The experimental results show that the measure time in six-DOF poses of the subreflector in a large-aperture antenna is at most 0.5 s, while the measurement accuracy error of translation is within 0.0131 mm and the error of rotation is within 0.2323°, which indicates that the pose measurement method of the subreflector in large antennas based on stereo structured light is efficient and applicable enough to analyze the measurement system accuracy.

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A direct calibration method for line structured light measurement system based on parallel lines

Cited by 8 publications

References 14 publications

A calibration method for line-structured light using mirror-based virtual binocular vision system

A calibration method for line-structured light using mirror-based virtual binocular vision system

Multilevel diffraction gratings inside silicon towards spectral filtering

Optimization and accuracy analysis in pose measurement of the subreflectors of large antennas based on stereo structured light

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