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2021
DOI: 10.1109/tim.2021.3077675
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A Diode-Based Fault Detection, Classification, and Localization Method for Photovoltaic Array

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Cited by 26 publications
(9 citation statements)
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“…It is unlike a situation where it is found that a PV module has faulty bypass diodes in open-and short-circuit conditions at the exact instant. Because when a bypass diode fails open, it can develop a hotspot in the sub-string, and subsequently, as time progresses, the diodes will be affected by excessive forward current and cause these to fail in open mode [6] as well. In contrast, when a bypass diode fails short-circuit, the voltage of the PV module will drop, so there will be little likelihood of diodes failing in the open mode at the same time.…”
Section: B Proposed Ann Modelmentioning
confidence: 99%
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“…It is unlike a situation where it is found that a PV module has faulty bypass diodes in open-and short-circuit conditions at the exact instant. Because when a bypass diode fails open, it can develop a hotspot in the sub-string, and subsequently, as time progresses, the diodes will be affected by excessive forward current and cause these to fail in open mode [6] as well. In contrast, when a bypass diode fails short-circuit, the voltage of the PV module will drop, so there will be little likelihood of diodes failing in the open mode at the same time.…”
Section: B Proposed Ann Modelmentioning
confidence: 99%
“…The second metric is the sensitivity (ideal case = 100%) which is the ratio of true positives samples divided by the total number of true positives and false negatives. This metric is calculated using (6).…”
Section: Tim-22-05067mentioning
confidence: 99%
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“…Accordingly, most of the previous research has been done based on theorical assumptions [2], on data generated by simulation [3,4], or on limited recorded data from laboratory tests [5]. Moreover, in most of these studies, only electrical faults such as line to line (LL), line to ground (LG), and open circuit (OC) were considered for detection [5][6][7][8][9][10]. Non-electrical faults such as glass breakage were not considered and only a limited number of studies were undertaken to detect some of the physical faults such as connector faults [3,11] or potential induced degradation (PID) faults [4,7,12].…”
Section: Introductionmentioning
confidence: 99%
“…The two standards, that is, national electric code (NEC) and the international electro-technical commission (IETC) are adopted to ensure the safe installation of the PV and DCMG [5,6]. The traditionally used devices, that is, overcurrent protection device (OCPD) and ground fault protection device (GFPD) presented in the literature have practical defects as these devices fail to detect the L-L/ L-G faults in PVs for longer durations [7][8][9].…”
Section: Introductionmentioning
confidence: 99%