2010
DOI: 10.1016/j.msea.2010.08.011
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A dilatometric and high-temperature X-ray diffraction study of cold deformation effect on the interaction between precipitation, recovery and recrystallization reactions in Al–12wt.% Mg alloy

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Cited by 18 publications
(12 citation statements)
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“…Consequently, the driving pressure for recrystallization is still very high even after long annealing treatment at low temperature. Since the overall solute content within the matrix is far from negligible (17 at.%; see Table 1), the solute atoms may act as obstacles and largely impede dislocation mobility [46]. At temperatures high enough to allow oxide precipitation, the precipitates have the same impeding effect.…”
Section: Stage I: Mechanisms Operating At Low Temperaturementioning
confidence: 99%
“…Consequently, the driving pressure for recrystallization is still very high even after long annealing treatment at low temperature. Since the overall solute content within the matrix is far from negligible (17 at.%; see Table 1), the solute atoms may act as obstacles and largely impede dislocation mobility [46]. At temperatures high enough to allow oxide precipitation, the precipitates have the same impeding effect.…”
Section: Stage I: Mechanisms Operating At Low Temperaturementioning
confidence: 99%
“…It is also pertinent to note in this context that the recrystallization effect dominates over the phase transformation effect and the temperature of 850°C can be regarded as the recrystallization stop temperature of the cold-rolled material. Dilatometry is also used to determine the recrystallization stop temperature of materials [22][23][24][25] apart from measuring phase transformation temperatures and kinetics, quantification of phases, etc. [26][27][28].…”
Section: Resultsmentioning
confidence: 99%
“…Among anisothermal techniques, the dilatometric analysis has been recently used to follow the recovery, recrystallization and precipitation in cold worked alloys [11,12]. Furthermore, the Xray line profile analysis (XRPA), which is a powerful alternative to transmission electron microscopy, is used for describing the microstructures of crystalline materials [13,14].…”
Section: Introductionmentioning
confidence: 99%