2004
DOI: 10.1088/0957-0233/15/3/005
|View full text |Cite
|
Sign up to set email alerts
|

A digital holographic microscope for complete characterization of microelectromechanical systems

Abstract: Digital holographic microscopy (DHM) can be described as a non-invasive metrological tool for inspection and characterization of microelectromechanical structures (MEMS). DHM is a quick, non-contact and non-invasive technique that can offer a high resolution in both lateral and vertical directions. It has been employed for the characterization of the undesired out-of-plane deformations due to the residual stresses introduced by technological processes. The characterization of these deformations is helpful in s… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
82
0
1

Year Published

2010
2010
2022
2022

Publication Types

Select...
4
4

Relationship

0
8

Authors

Journals

citations
Cited by 150 publications
(83 citation statements)
references
References 27 publications
0
82
0
1
Order By: Relevance
“…DHM is particularly useful for MEMS characterization because of the relatively smooth and well-defined surface profile [60,190]. Microcantilever beams, bridges, and membranes are imaged by quantitative phase holography [22].…”
Section: Microscopy and Metrology Of Microstructuresmentioning
confidence: 99%
See 1 more Smart Citation
“…DHM is particularly useful for MEMS characterization because of the relatively smooth and well-defined surface profile [60,190]. Microcantilever beams, bridges, and membranes are imaged by quantitative phase holography [22].…”
Section: Microscopy and Metrology Of Microstructuresmentioning
confidence: 99%
“…Microcantilever beams, bridges, and membranes are imaged by quantitative phase holography [22]. The multiwavelength optical phase unwrapping of phase images yields shape and deformation measurements with submicron precision over a many-micron range [151,169,190]. Various optical techniques, including digital holography, for characterization of MEMS devices are reviewed in Ref.…”
Section: Microscopy and Metrology Of Microstructuresmentioning
confidence: 99%
“…The second consequence is that normalization by the reference, Equation 3.14, is not strictly necessary since the reference has already been cancelled from the intensity terms of Equation 3.86. Normalizing by a spherical reference actually adds an unnecessary phase distortion which must be removed after propagation (see, e.g., [75]). …”
Section: Subtle Lessonsmentioning
confidence: 99%
“…The real and imaginary components are useful as diagnostics, as components of focus metrics [89], [274], as representations of the objects, or for computing the quantitative phase of imaged objects [75]. The squared magnitude gives the intensity which would be observed using optical reconstruction methods.…”
Section: Introduction To Digital Holographymentioning
confidence: 99%
“…It is suitable for high-resolution label-free analysis of living cells [3], for investigations on reflective surfaces such as microelectromechanical systems [4] as well as surface profiling with nanometer accuracy. To the best of our knowledge, the numercialreconstruction process that is used both in industry and in the research community employs floatingpoint arithmetic.…”
mentioning
confidence: 99%