Phase Change Materials (PCMs) are increasingly being used in the area of energy sustainability. Thermal characterization is a prerequisite for any reliable utilization of these materials. Current characterization methods including the well-known T-history method depend on accurate temperature measurements. This paper investigates the impact of different thermistor linearization techniques on the temperature uncertainty in the T-history characterization of PCMs. Thermistor sensors and two linearization techniques were evaluated in terms of achievable temperature accuracy through consideration of both, nonlinearity and self-heating errors. T-history measurements of RT21 (RUBITHERM Ò GmbH) PCM were performed. Temperature measurement results on the RT21 sample suggest that the SerialeParallel Resistor (SPR) 1 linearization technique gives better uncertainty (less than AE0.1 C) in comparison with the Wheatstone Bridge (WB) 1 technique (up to AE1.5 C). These results may considerably influence the usability of latent heat storage density of PCMs in the certain temperature range. They could also provide a solid base for the development of a T-history measuring device.