A Description of the Basic Mechanisms of Electrical Excitation Techniques for Simulating System-Generated EMP

Higgins, Daniel F.

doi:10.1109/tns.1976.4328606

Cited by 5 publications

(2 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…From these calculations, it appears that the electric field is normal to the surface of the converter, and the spatial distribution in its plane is related to the electron flux. The magnetic field is oriented azimuthally around Ox, and is related to the transverse gradients of the electron flux [20].…”

Section: E 3d Maxwell-vlasov Particle-in-cell Calculation Of the Elementioning

confidence: 99%

See 1 more Smart Citation

Contribution of Electromagnetic Perturbation to the Transient Response of an Electronic Circuit Exposed to a High Multi-MeV X-Ray Flux

Ribière

Demarquay

Maulois

et al. 2015

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

The contribution of the electromagnetic field to the electric response of a circuit exposed to high x-ray flux is quantified based on a novel approach which combines both experimental and numerical tools. First, we describe the method used to quantify the ionizing and electromagnetic stress induced by the x-ray beam in free space as well as on the target circuit. Next we show the perturbation resulting from the x-ray irradiation of an analog circuit. Also, we present the effect of an electromagnetic plane wave on the electric response of the circuit. Based on the comparison of experimental results, we demonstrate that electromagnetic fields coupling resulting from photoelectrons produced by the x-ray/circuit interaction is similar to the coupling induced by an external electromagnetic plane wave.Index Terms-Monte-Carlo calculations, particle-in-cell calculations, system generated electromagnetic pulse, transient radiation effects on electronics.

show abstract

Section: E 3d Maxwell-vlasov Particle-in-cell Calculation Of the Elementioning

confidence: 99%

“…Experiments have been performed at 350 A/m, according to the voltage generator performance and the dimensions of the TEM cell. The normal of the surface of the circuit is set collinear with the electric field generated by the TEM cell, in order to reproduce SGEMP conditions [20].…”

Section: B Similarity Between Sgemp-induced Current and Pulsed Em Plmentioning

confidence: 99%

Contribution of Electromagnetic Perturbation to the Transient Response of an Electronic Circuit Exposed to a High Multi-MeV X-Ray Flux

Ribière

Demarquay

Maulois

et al. 2015

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

Particle-in-cell simulations of multi-MeV pulsed X-ray induced air plasmas at low pressures

et al. 2016

View full text Add to dashboard Cite

A full kinetic modelling of the charge particles dynamics generated upon the irradiation of an air-filled cavity by a multi-MeV pulsed x-ray is performed. From the calculated radiative source generated by the ASTERIX generator, we calculated the electromagnetic fields generated by x-ray induced air plasmas in a metallic cavity at different pressures. Simulations are carried out based on a Particle-In-Cell interpolation method which uses 3D Maxwell-Vlasov calculations of the constitutive charged species densities of air plasmas at different pressures at equilibrium. The resulting electromagnetic fields within the cavity are calculated for different electron densities up to 4 × 1010 cm−3. For each air pressure, we show electronic plasma waves formation followed by Landau damping. As electron density increases, the calculations exhibit space-charged neutralization and return current formation.

show abstract

Development and Implementation of Electrical Excitation Techniques for Satellites

O'Donnell

Tasca

Tumolillo³

et al. 1980

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

A Description of the Basic Mechanisms of Electrical Excitation Techniques for Simulating System-Generated EMP

Cited by 5 publications

References 2 publications

Contribution of Electromagnetic Perturbation to the Transient Response of an Electronic Circuit Exposed to a High Multi-MeV X-Ray Flux

Contribution of Electromagnetic Perturbation to the Transient Response of an Electronic Circuit Exposed to a High Multi-MeV X-Ray Flux

Particle-in-cell simulations of multi-MeV pulsed X-ray induced air plasmas at low pressures

Development and Implementation of Electrical Excitation Techniques for Satellites

Contact Info

Product

Resources

About