2008
DOI: 10.1063/1.2969260
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A dedicated powder diffraction beamline at the Advanced Photon Source: Commissioning and early operational results

Abstract: A new dedicated high-resolution high-throughput powder diffraction beamline has been built, fully commissioned, and opened to general users at the Advanced Photon Source. The optical design and commissioning results are presented. Beamline performance was examined using a mixture of the NIST Si and Al(2)O(3) standard reference materials, as well as the LaB6 line-shape standard. Instrumental resolution as high as 1.7 x 10(-4) (DeltaQQ) was observed.

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Cited by 358 publications
(334 citation statements)
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“…High resolution synchrotron powder diffraction data were collected using beamline 11-BM at the Advanced Photon Source (APS), Argonne National Laboratory using an average wavelength of 0.413850 Å. Discrete detectors covering an angular range from -6 to 16° 2θ were scanned over a 34° 2θ range, with data points collected every 0.001° 2θ at a scan speed of 0.01°/s. 23,24 Samples were diluted with amorphous SiO 2 to keep absorption µr to < 1.5 cm -1 and sealed inside polyimide capillaries. Magnetic measurements were carried out using a Quantum Design SQUID magnetometer in the temperature range 2-300 K on samples (c.a.…”
Section: Methodsmentioning
confidence: 99%
“…High resolution synchrotron powder diffraction data were collected using beamline 11-BM at the Advanced Photon Source (APS), Argonne National Laboratory using an average wavelength of 0.413850 Å. Discrete detectors covering an angular range from -6 to 16° 2θ were scanned over a 34° 2θ range, with data points collected every 0.001° 2θ at a scan speed of 0.01°/s. 23,24 Samples were diluted with amorphous SiO 2 to keep absorption µr to < 1.5 cm -1 and sealed inside polyimide capillaries. Magnetic measurements were carried out using a Quantum Design SQUID magnetometer in the temperature range 2-300 K on samples (c.a.…”
Section: Methodsmentioning
confidence: 99%
“…After the first centrifugation, precipitates were washed five times with 1.5 mL of 70% ethanol by centrifugation and decanting, and an aliquot of the resuspended products was then placed on a TEM copper-formvar grid and dried at 37°C overnight before analysis with a Tecnai G2 Sphera electron microscope at an operating voltage of 200 kV. High-resolution synchrotron powder diffraction data were collected using beamline 11-BM at the Advanced Photon Source, Argonne National Laboratory, using an average wavelength of 0.13702 Å (44). A mixture of National Institute of Standards and Technology standard reference materials, Si (SRM 640c), and Al 2 O 3 (SRM 676) was used to calibrate the instrument, with the Si lattice constant calibrating the wavelength for each detector.…”
Section: Methodsmentioning
confidence: 99%
“…This is somewhat disadvantageous due to the limited beam time available at neutron and synchrotron facilities. However, recent developments, like the mail-in service at beamline 11-BM of the Advanced Photon Source at Argonne National Laboratory [13], enable access to high resolution, synchrotron quality, powder diffraction data in a convenient and timely fashion.…”
Section: Description Of the Experimental Methodologymentioning
confidence: 99%
“…High resolution synchrotron powder diffraction data were collected using beamline 11-BM at the Advanced Photon Source (APS) at Argonne National Laboratory, using a wavelength of 0.413 52Å. Discrete detectors covering an angular range from −6 • to 16 • 2θ were scanned over a 34 • 2θ range, with data points collected every 0.001 • 2θ and a scan speed of 0.01 • s −1 [13,22,23]. For the Rietveld refinement we used EXPGUI software [24], a graphical interface for the GSAS package [25].…”
Section: X-ray Powder Diffraction (Xrd)mentioning
confidence: 99%