A curved image-plate detector system for high-resolution synchrotron X-ray diffraction

Abstract

The developed curved image plate (CIP) is a one-dimensional detector which simultaneously records high-resolution X-ray diffraction (XRD) patterns over a 38.7 degrees 2theta range. In addition, an on-site reader enables rapid extraction, transfer and storage of X-ray intensity information in </=30 s, and further qualifies this detector to study kinetic processes in materials science. The CIP detector can detect and store X-ray intensity information linearly proportional to the incident photon flux over a dynamical range of about five orders of magnitude. The linearity and uniformity of the CIP detector response is not compromised in the unsaturated regions of the image plate, regardless of saturation in another region. The speed of XRD data acquisition together with excellent resolution afforded by the CIP detector is unique and opens up wide possibilities in materials research accessible through X-ray diffraction. This article presents details of the basic features, operation and performance of the CIP detector along with some examples of applications, including high-temperature XRD.

Visualizing charge densities and electrostatic potentials in materials by synchrotron X-ray powder diffraction

“…One is to obtain high angular resolution by analyser crystals in front of point detectors [7,8]. The other is to obtain high counting statistics data by position-sensitive or area detectors [9]. ID31 [7] of ESRF is designed to collect data with higher angular resolution up to 0.001° in 2θ, aiming at solving crystal structure from a powder specimen.…”

In situ studies of oxidation of ZrB2 and ZrB2–SiC composites at high temperatures

“…36 All experiments were conducted at the 33BM-C beam line at the Advanced Photon Source (APS) at Argonne National Laboratory, Argonne, IL, USA. The experimental set-up used for these studies is shown in Fig.…”

“…A specially designed quadrupole lamp furnace (QLF), which allows heating of samples up to 2000 • C in air, [32][33][34][35] was used in conjunction with a high resolution curved image plate (CIP) detector for these studies. 36,37 Using this method, the oxidation of ZrB 2 to ZrO 2 was monitored in real time, independent of other accompanying processes.…”

Effect of transition-metal-ion doping on high temperature thermal expansion of 3:2 mullite—An in situ, high temperature, synchrotron diffraction study

“…The details of the construction, operation and capabilities of the CIP detector are reported elsewhere. 39,40 The CIP detector was aligned and calibrated using a Si(1 1 1) analyzer crystal and the LaB 6 powder standard for XRD (SRM 660a, National Institute of Standards and Technology, Gaithersburg, MD). Incident monochromatic X-rays of two different wavelengths, 0.550784Å and 0.563084Å, as calibrated with SRM 660a, were used in this work.…”