1994
DOI: 10.1002/rcm.1290080924
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A curved field reflectron time‐of‐flight mass spectrometer for the simultaneous focusing of metastable product ions

Abstract: The ability to simultaneously focus a wide mass range of metastable fragment ions formed after the initial ionization event in a matrix-assisted laser desorption/ionization time-of-flight mass spectrometer has been made possible by the development of a new type of ion reflector. This coaxially designed time-of-flight instrument employs a modified single stage reflector whose axial voltage gradient rises differentially in order to produce an alignment of energy focal points for product ions. In contrast, produc… Show more

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Cited by 113 publications
(82 citation statements)
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“…Cornish and Cotter built a reflectron in which the retarding field increases with its depth, as in the parabolic reflectron. The electric field inside this curved-field reflectron (CFR) [33,34] which would result in a good daughter ion resolution was determined through SIMION [35] calculation and realized in the actual instrument by adjusting resistances between 85 electrode pairs.…”
Section: Tandem Tof Mass Spectrometers: a Brief Reviewmentioning
confidence: 99%
“…Cornish and Cotter built a reflectron in which the retarding field increases with its depth, as in the parabolic reflectron. The electric field inside this curved-field reflectron (CFR) [33,34] which would result in a good daughter ion resolution was determined through SIMION [35] calculation and realized in the actual instrument by adjusting resistances between 85 electrode pairs.…”
Section: Tandem Tof Mass Spectrometers: a Brief Reviewmentioning
confidence: 99%
“…Because this type of reflector permits the simultaneous focusing of a wide mass range of fragment ions formed by metastable decay, the product ion mass spectrum can be collected without requiring any stepwise adjustment of the reflectron under unchanged conditions. 9,10 The operating conditions were as follows: nitrogen laser (337 nm); reflectron mode; detection of positive ions. The ion detector of this instrument is an electron multiplier type.…”
Section: Maldi-tof Mass Spectrometrymentioning
confidence: 99%
“…9,10 Thus, the product-ion mass spectra can be collected without an adjustment under the same conditions, thereby eliminating the need to scan the reflector voltage. Therefore, the relative intensity of the PSD fragment ions can be discussed at an accurate level.…”
Section: Introductionmentioning
confidence: 99%
“…Further, tandem time-of-flight mass spectrometry (TOF/TOF) is a technique in which two time-of-flight mass spectrometers are arranged in tandem and used consecutively [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. Precursor ions are selected by the first time-of-flight mass spectrometer (TOF1), and the fragment ions derived from them are mass analyzed by the second time-of-flight mass spectrometer (TOF2).…”
Section: Introductionmentioning
confidence: 99%
“…With the exception of tandem sector mass spectrometry, MALDI-TOF/TOF is the only instrument capable of observing HE-CID fragment pathways [17]. On the other hand, the ions generated by MALDI often cause post-source decay (PSD) [11][12][13][14]. The overlapping of PSD and HE-CID fragment pathways complicates the product ion spectrum.…”
Section: Introductionmentioning
confidence: 99%