2000
DOI: 10.1016/s1359-6454(00)00214-7
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A crystallographic mechanism for fatigue crack propagation through grain boundaries

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Cited by 386 publications
(193 citation statements)
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“…Studies of fatigue of polycrystalline alloys at grain level indicated that crack nucleation and subsequent transgranular growth tend to follow the slip planes due to the shear deformation associated with the slip systems [e.g., 27,30,35,53]. Along the same line, here it was proposed that crack growth in the grain interior will follow the direction of slip trace with the maximum accumulated slip, which can be computed from the crack-tip deformation analyses.…”
Section: Prediction Of Crack Growth Pathmentioning
confidence: 88%
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“…Studies of fatigue of polycrystalline alloys at grain level indicated that crack nucleation and subsequent transgranular growth tend to follow the slip planes due to the shear deformation associated with the slip systems [e.g., 27,30,35,53]. Along the same line, here it was proposed that crack growth in the grain interior will follow the direction of slip trace with the maximum accumulated slip, which can be computed from the crack-tip deformation analyses.…”
Section: Prediction Of Crack Growth Pathmentioning
confidence: 88%
“…As the material has a fine grain micro-structure, it seems plausible to assume that crack will grow along the slip trace without changing to another direction within the gain. Also, for polycrystalline material, experiment observations show that crack growth tend to follow the slip plane in each grain and a change of crack growth behaviour mostly happens when crossing the grain boundaries due to the change of favourable slip planes [27,30].…”
Section: Prediction Of Crack Growth Pathmentioning
confidence: 99%
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“…That is, the interested region can be approximately seem as being deformed under uniaxial compressive stress during the bending process. Therefore, Schmid factor analysis is a common method in grain strain capacity under uniaxial compressive stress [9,20,21]. Fig.…”
Section: Resultsmentioning
confidence: 99%