2002
DOI: 10.1109/7260.989861
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A CPW T-resonator technique for electrical characterization of microwave substrates

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Cited by 36 publications
(18 citation statements)
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“…Its dielectric constant ( ε r ) and loss tangent were determined using a T-resonator method [19,20]. The resonant frequency of the rectangular patch can be calculated as follows [21,22]: f0=c2εeff{Lp+0.824Hs[(εeff+0.3)(WpHs+0.264)(εeff0.258)(WpHs+0.8)]} εeff=εr+12+εr12[11+12(hsWp)] where ε eff is the effective dielectric constant resulting from the fringe fields and H s is the thickness of the substrate.…”
Section: Strain Sensor Designmentioning
confidence: 99%
See 1 more Smart Citation
“…Its dielectric constant ( ε r ) and loss tangent were determined using a T-resonator method [19,20]. The resonant frequency of the rectangular patch can be calculated as follows [21,22]: f0=c2εeff{Lp+0.824Hs[(εeff+0.3)(WpHs+0.264)(εeff0.258)(WpHs+0.8)]} εeff=εr+12+εr12[11+12(hsWp)] where ε eff is the effective dielectric constant resulting from the fringe fields and H s is the thickness of the substrate.…”
Section: Strain Sensor Designmentioning
confidence: 99%
“…The values of ε r and loss tangent of the PDMS were determined to be 3 and 0.02, respectively. In order to characterize dielectric constants and loss tangent of the PDMS, we used T-resonator technique, as introduced in [19,20]. The width ( W p ) and length ( L p ) of the rectangular patch were therefore set at 17 mm and 23 mm, respectively, to allow the device to resonate at 3.7 GHz.…”
Section: Strain Sensor Designmentioning
confidence: 99%
“…Omitting the parasitic reactances of the structure, the stub has a transmission minimum when the stub length is an odd multiple of g/4, or when the open circuit termination is translated to a shunt short circuit at the tee junction. Therefore, the effective permittivity may be determined from (1) [16]. Wirebonds are used at the T-junction to minimize the excitation of the slotline parasitic mode.…”
Section: Effective Permittivity By Shunt Stubmentioning
confidence: 99%
“…From literature, the T-resonator [4][5] and TL technique [6] are among some of the common methods used for dielectric property characterization, since these methods do not require special test fixtures and are low cost (printed using lithography). For the T-resonator technique, the effective dielectric constant and attenuation can be obtained from the equations provided in [5].…”
Section: Introductionmentioning
confidence: 99%
“…For the T-resonator technique, the effective dielectric constant and attenuation can be obtained from the equations provided in [5]. Nevertheless, it is of great interest to vendors to obtain the relative dielectric constant and loss tangent values of their material.…”
Section: Introductionmentioning
confidence: 99%