A convenient self-checking method for the automated microwave measurement of mu and epsilon

Somlo, P.I.

doi:10.1109/19.278551

Cited by 30 publications

(47 citation statements)

References 1 publication

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“…The achievable measurement accuracy is limited. In the transmission line techniques, reflection coefficient and transmission coefficient are measured for a section of waveguide or coaxial line filled with the material sample under test [7][8][9][10][11][12][13]. Adequate sample thickness must be used in order to obtain an accurate measurement result.…”

Section: Introductionmentioning

confidence: 99%

Dielectric Constant Measurement for Thin Material at Microwave Frequencies

Chung¹

2007

PIER

121

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Abstract-A practical problem in the reflection method for dielectric constant measurement is the difficulty to ensure the sample is placed exactly at the waveguide flange. A small position offset of the dielectric sample will give rise to some errors in calculating the dielectric constant, especially when a thin sample is used. To circumvent this problem, a method to determine the dielectric constant by measuring the transmission coefficient of the thin slab placed in a waveguide has been developed. Slab position offset from the measurement reference plane has no effect on the measurement accuracy. An explicit expression for the dielectric constant is obtained in terms of the transmission coefficient by simplifying the exact solution for transmission through a thin dielectric slab. The method is verified with measurement on Teflon of 0.5-mm thickness. The measured dielectric constant of Teflon shows excellent agreement of both ε and ε with published data. Subsequently, the dielectric constant of a vegetation leaf was measured.

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Section: Introductionmentioning

confidence: 99%

Dielectric Constant Measurement for Thin Material at Microwave Frequencies

Chung¹

2007

PIER

121

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“…Using samples with a thickness less than one-half guided wavelength of the fundamental mode in the sample will suppress these modes [25]. Another option could be using two extra waveguide sections with lengths greater than 70 mm (greater than two free-space wavelengths) between the sample and coaxial-to-waveguide adapters for thick samples [25,26]. This is because higher-order modes will die out drastically in a short distance away from the sample and real measurements are performed near the adapters [26].…”

Section: Resultsmentioning

confidence: 99%

A Simple Approach for Evaluating the Reciprocity of Materials Without Using Any Calibration Standard

Hasar¹,

Şimşek²

2009

PIER

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Abstract-A simple approach for evaluation of the reciprocity of materials using raw scattering parameter measurements is proposed. This approach not only reduces the overall measurement time but also eliminates the need for calibrating the measurement system since it uses calibration-independent measurements. We have derived a metric function for reflecting and nonreflecting cells, which are used to house the sample under test. This function does not depend on electrical properties of materials and their lengths, and whether the cell is reflecting. We have also investigated the effects of the sample length and air pockets between sample external surfaces and cell inner walls on the performance of the evaluation of sample reciprocity.

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“…Another option could be using two extra waveguide sections with lengths greater than 70 mm (greater than two free-space wavelengths) between the reference planes and coaxial-to-waveguide adapters for thick samples [12,[21][22][23][24]. This is because higher-order modes will die out drastically in a short distance away from the sample and real measurements are performed near the adapters [22].…”

Section: Derivation Of Complex S-parametersmentioning

confidence: 99%

“…On the other hand, if a coaxial line sample holder is used and dimensioned so that only single mode operation is possible, the dimensions become small and meniscus and other dimensional uncertainties may adversely affect the measurements [22]. Because waveguide measurements are highly sensitive, sample preparation for these measurements is relatively easy, and mechanical connections of waveguide sections are simple and robust, waveguide sample holders have effectively been applied for precise and accurate dielectric characterization of liquid samples [14,15,17,18,22,23].…”

Section: Introductionmentioning

confidence: 99%

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Thickness-Independent Automated Constitutive Parameters Extraction of Thin Solid and Liquid Materials From Waveguide Measurements

Hasar¹

2009

PIER

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Abstract-The constitutive parameters measurement of thin solid and liquid materials by transmission-reflection methods generally suffers from a) the requirement of the transformation of measured scattering parameters from the reference plane to the end surfaces of the material (measurement plane) and b) inaccurate knowledge on the length of the material, if the material does not fill the entire measurement cell (a waveguide or coaxial-line section). In this research paper, a microwave waveguide method for constitutive parameters determination of these materials is proposed to simultaneously eliminate these problems. There are three main advantages of the proposed method as: a) it explicitly determines the constitutive parameters from measured S-parameters; b) it does not require the knowledge about sample length since it directly measures it as a byproduct of the method; and c) it offers a self-checking feature to trace the performance and accurateness of measurements. This feature does not depend on the constitutive parameters of the sample. We measured the complex permittivity of some thin solid and liquid test samples for validation of the method.

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A convenient self-checking method for the automated microwave measurement of mu and epsilon

Cited by 30 publications

References 1 publication

Dielectric Constant Measurement for Thin Material at Microwave Frequencies

Dielectric Constant Measurement for Thin Material at Microwave Frequencies

A Simple Approach for Evaluating the Reciprocity of Materials Without Using Any Calibration Standard

Thickness-Independent Automated Constitutive Parameters Extraction of Thin Solid and Liquid Materials From Waveguide Measurements

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