A confocal set-up for micro-XRF and XAFS experiments using diamond-anvil cells

Wilke, Max; Appel, Karen; Vincze, László; Schmidt, Christian; Borchert, Manuela; Pascarelli, S.

doi:10.1107/s0909049510023654

Cited by 36 publications

(24 citation statements)

References 20 publications

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“…Currently, the detection limit for HP XFS is at a few ppm level for elements down to atomic number 22 (Ti) and to a pressure of 10 GPa at high temperatures to at least 1273 K [253][254][255]. A confocal geometry has been developed for minimizing unwanted background signals [256], further improving efficiency and consequently lowering the detection limit.…”

Section: Hp X-ray Fluorescence Spectroscopymentioning

confidence: 99%

High-pressure studies with x-rays using diamond anvil cells

2016

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Pressure profoundly alters all states of matter. The symbiotic development of ultrahighpressure diamond anvil cells, to compress samples to sustainable multi-megabar pressures; and synchrotron x-ray techniques, to probe materials' properties in situ, has enabled the exploration of rich high-pressure (HP) science. In this article, we first introduce the essential concept of diamond anvil cell technology, together with recent developments and its integration with other extreme environments. We then provide an overview of the latest developments in HP synchrotron techniques, their applications, and current problems, followed by a discussion of HP scientific studies using x-rays in the key multidisciplinary fields. These HP studies include: HP x-ray emission spectroscopy, which provides information on the filled electronic states of HP samples; HP x-ray Raman spectroscopy, which probes the HP chemical bonding changes of light elements; HP electronic inelastic x-ray scattering spectroscopy, which accesses high energy electronic phenomena, including electronic band structure, Fermi surface, excitons, plasmons, and their dispersions; HP resonant inelastic x-ray scattering spectroscopy, which probes shallow core excitations, multiplet structures, and spin-resolved electronic structure; HP nuclear resonant x-ray spectroscopy, which provides phonon densities of state and time-resolved Mössbauer information; HP x-ray imaging, which provides information on hierarchical structures, dynamic processes, and internal strains; HP x-ray diffraction, which determines the fundamental structures and densities of single-crystal, polycrystalline, nanocrystalline, and non-crystalline materials; and HP radial x-ray diffraction, which yields deviatoric, elastic and rheological information. Integrating these tools with hydrostatic or uniaxial pressure media, laser and resistive heating, and cryogenic cooling, has enabled investigations of the structural, vibrational, electronic, and magnetic properties of materials over a wide range of pressure-temperature conditions.

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Section: Hp X-ray Fluorescence Spectroscopymentioning

confidence: 99%

High-pressure studies with x-rays using diamond anvil cells

2016

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“…This confocal setup enhances the quality of the fluorescence and XAFS spectra and, thus, the sensitivity for detecting elements at low concentrations. It efficiently suppresses signal from outside the sample chamber, which stems from elastic and inelastic scattering of the incoming beam by the diamond anvils as well as from excitation of fluorescence from the body of the diamondanvil cell (Wilke et al 2010). …”

Section: Experimental Design Of Confocal Xafsmentioning

confidence: 98%

Confocal X-ray technology based on capillary X-ray optics

Sun¹,

Ding²

2015

Reviews in Analytical Chemistry

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Capillary X-ray optics is versatile, and it can be used with synchrotron radiation source, conventional X-ray source, laser-plasma ultrafast X-ray source, and so forth. Recently, the confocal X-ray technology based on capillary X-ray optics has become popular, and it has been widely used in X-ray fluorescence, X-ray absorption fine structure, X-ray diffraction, small-angle X-ray scattering, X-ray imaging, and X-ray scattering. This confocal X-ray technology has applications in many fields, including environmental monitoring, food science, life science, chemistry, physics, nanomaterials, nondestructive test, security check, and so on.

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“…Of course, it also enables a depth elemental profiling. There are many reports of depth elemental profiling for layered materials such as paint layers [29][30][31][32][33][34][35][36][37][38][39]. The author's research group at OCU has reported a depth elemental profile for car paint chips, which have several layers depending on the type of car and manufacturing process [40].…”

Section: Confocal Micro-xrf In the Laboratorymentioning

confidence: 99%