2005
DOI: 10.1063/1.1992666
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A comprehensive review of ZnO materials and devices

Abstract: Undoped and Ga-and Al-doped ZnO films were synthesized using sol-gel and spin coating methods and characterized by X-ray diffraction, high-resolution scanning electron microscopy (SEM), optical spectroscopy and Hall-effect measurements. SEM measurements reveal an average grain size of 20 nm and distinct individual layer structure. Measurable conductivity was not detected in the unprocessed films; however , annealing in hydrogen or zinc environment induced significant conductivity (∼10 −2 Ω.cm) in most films. P… Show more

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Cited by 10,355 publications
(4,128 citation statements)
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References 647 publications
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“…The following values were used in this study: V 1 ) 0.27, E 1 ) 169 GPa for the silicon tip, and V 2 ) 0.3, an average value calculated using the elastic constants tabulated in ref 18. The contact radius a is given by the Hertz model:…”
Section: ∂F/∂dmentioning
confidence: 99%
“…The following values were used in this study: V 1 ) 0.27, E 1 ) 169 GPa for the silicon tip, and V 2 ) 0.3, an average value calculated using the elastic constants tabulated in ref 18. The contact radius a is given by the Hertz model:…”
Section: ∂F/∂dmentioning
confidence: 99%
“…In the past decade, the demonstration of a large variety of functional ZnO nanowire (NW) devices such as field effect transistors, 2,3 optically pumped lasers, 4,5 and chemical and biological sensors 6 have aroused growing interest in this material. 7 In particular, ZnO NW photodetectors and optical switches have been the subject of extensive investigations. [8][9][10][11][12][13][14][15][16][17][18] Despite the abundant research on NW photoconduction, 19 the two main factors contributing to the high photosensitivity of such nanostructures have been scarcely recognized: (1) the large surface-to-volume ratio and the presence of deep level surface trap states in NWs greatly prolongs the photocarrier lifetime; (2) the reduced dimensionality of the active area in NW devices shortens the carrier transit time.…”
mentioning
confidence: 99%
“…Figure 1a shows some typical I-V characteristics of the ZnO NWs in dark and under UV illumination (λ ) 390 nm) at various light intensities; the I-V curves are linear around zero applied bias, which indicates good ohmic behavior of the Ti/Au contacts. 7 The linear increase of the current with applied bias (V) is due to the increase of the carrier drift velocity, hence the reduction of the transit time (T t ) l 2 /µV, where µ is the carrier mobility and l is the separation between the electrodes). The current measured in the NW increases significantly under illumination: by varying the light intensity from 6.3 µW/cm 2 to 40 mW/cm 2 , the current increases from 2 to 5 orders of magnitude, as seen in Figure 1b, where the I-V curves have been redrawn on a natural logarithmic scale.…”
mentioning
confidence: 99%
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“…1,2 The attraction of ZnO is the result of its high purity, high crystallinity, wide direct energy band gap (3.37 eV), large excitation binding energy (60 meV), piezoelectricity, and biocompatibility, as well as the divisive nanostructures. 3 Since the successful growth of aligned ZnO nanowires on a single-crystal substrate, [4][5][6] a system that may be very useful for vertical device fabrication has been found. As a result, great interest in acquiring more control over the alignments, including supporting substrates, distribution of nanowires, and density of nanowires, to maximally meet the requirements of nanodevices has been inspired.…”
mentioning
confidence: 99%