A comprehensive review of reliability assessment methodologies for grid‐connected photovoltaic systems

Abstract

This paper provides a comprehensive review of the research work related to Reliability Assessment Methodologies for grid‐connected photovoltaic (PV) systems performed in recent literature. Solar power is emerging as the fast growing source of energy in the world as a result of rising environmental concerns regarding the hazards of climatic change linked with the production of electricity using fossil fuels. Although PV systems can support small businesses and households on their own, many people prefer a grid‐connected PV system (PVS) because of the net profit it provides. Grid‐integrated PV system, however, comes with many reliability issues. Evaluating the reliability of grid‐integrated photovoltaic system is thus an important area of research. The article presents a critical survey of the state‐of‐art technologies for assessing the reliability of a PV system. Issues related to the reliability of the grid‐integrated PVS are spotted along with the solution techniques. Reliability indices for analyzing the PVS performance are also discussed.

A Step-by-Step Methodology for Obtaining the Reliability of Building Microgrids Using Fault TreeAnalysis

“…In this paper, we opt for the exponential distribution as it aligns well with the failure patterns observed in many electronic devices. This choice is supported by findings discussed in references [4,19,21,30] which highlight the prevalence of exponential failure behavior in electronic components and systems.…”

“…This comprehensive approach spans from circuit-level analysis to the identification of importance measures and minimal cut-sets through Fault Tree Analysis. Grounded in the meticulous evaluation of subsystems and electrical devices' failure rates, this methodology draws heavily from insights gleaned from comprehensive studies outlined in [4,8,11,16,17,[19][20][21]. The first step involves defining the MG and its main components.…”

“…Although the exponential distribution is not necessarily the correct distribution for failures in these components [4,6], our analysis employs this distribution. This is because, in most reliability databases, the failure rate of electronic systems is considered constant and represented by λ.…”