Abstract:As the semiconductor industry continues to shrink the transistor feature size, new fault models need to be invented and deployed to ensure manufacturing test and diagnostic of the highest quality. The Cell-Aware (CA) test and diagnosis methodology targets the detection of defects inside standard (std) cells, at the transistor level. While becoming an industry standard, the CA methodology, has a large and costly deployment overhead, involving numerous analog simulations. In [1], we presented an innovative flow … Show more
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