2023
DOI: 10.1007/s10854-023-10897-7
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A comprehensive insight into the parameters that influence the synthesis of Ag2MoO4 semiconductors via experimental design

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Cited by 3 publications
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“…Variations in the intensity and graphic profile of the crystallographic planes were observed when normalizing and superimposing the diffraction patterns of all samples. These variations were studied using structural refinement by the Rietveld method, which allowed a detailed study of the network parameters ( a , b , c , α, β, γ), atomic coordinates ( x , y , z ), Unit Cell Volume ( V ), Occupation of atoms ( O cc ), and the orientation of crystallographic planes. …”
Section: Resultsmentioning
confidence: 99%
“…Variations in the intensity and graphic profile of the crystallographic planes were observed when normalizing and superimposing the diffraction patterns of all samples. These variations were studied using structural refinement by the Rietveld method, which allowed a detailed study of the network parameters ( a , b , c , α, β, γ), atomic coordinates ( x , y , z ), Unit Cell Volume ( V ), Occupation of atoms ( O cc ), and the orientation of crystallographic planes. …”
Section: Resultsmentioning
confidence: 99%