2000
DOI: 10.1016/s0169-4332(99)00516-4
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A comparison of preparation methods of copper surfaces for in situ scanning force microscopy investigations

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Cited by 19 publications
(7 citation statements)
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“…The importance of the surface state for scanning force microscopy investigations was already depicted by Wadsak et al [57]. In this work two different polishing procedures were applied.…”
Section: Effect Of Polishing On the Copper Surfacementioning
confidence: 82%
“…The importance of the surface state for scanning force microscopy investigations was already depicted by Wadsak et al [57]. In this work two different polishing procedures were applied.…”
Section: Effect Of Polishing On the Copper Surfacementioning
confidence: 82%
“…Particularly, with atomic force microscopy (AFM) a tip is scanned in contact with the surface to generate a 3-D image with nanometer resolution. Scanning probe-based characterizations have been use to view the surface morphology of corrosion products formed on aluminum alloys [28], stainless steel A c c e p t e d M a n u s c r i p t 4 [29], copper [30,31] and iron [32]. Recently, AFM has been applied for surface analysis of the degradation of metals used in water distribution systems [13,33,34].…”
Section: Introductionmentioning
confidence: 99%
“…Previously, AFM has been applied for studies of the corrosion of materials such as steel, silver, and copper. [29][30][31][32][33][34][35] The effectiveness of corrosion inhibitors has also been evaluated using AFM characterizations. [36][37][38] Certain surface spectroscopy techniques such as SIMS and XRD can provide detailed information about the chemical nature of surface adsorbates and furnish complementary information for identifying the byproduct of corrosion.…”
Section: Introductionmentioning
confidence: 99%