“…The following supporting information can be downloaded at: , Figure S1: Observed (red symbols), calculated (black line), and difference (blue line) XRD profiles of Sample 3, Figure S2: Observed (red symbols), calculated (black line) and difference (blue line) X-ray diffraction profile of Sample 3 using Pbnm space group (ICSD: 88851, [ 1 ]), Figure S3: Both unit-cell parameters and corrected observed 2-theta values based on the Rietveld Refinement of XRD data of Sample 1 to perform the indexation of the corresponding XRD pattern, Figure S4: Both unit-cell parameters and corrected observed 2-theta values based on the Rietveld Refinement of XRD data of Sample 2 to perform the indexation of the corresponding XRD pattern, Figure S5: Both unit-cell parameters and corrected observed 2-theta values based on the Rietveld Refinement of XRD data of Sample 3 to perform the indexation of the corresponding XRD pattern, Figure S6: Unit-cell parameters, the corrected observed and calculated peak positions, and the respective difference obtained from the McMaille software for the case of Sample 1, Figure S7: Unit-cell parameters, the corrected observed and calculated peak positions, and the respective difference obtained from the McMaille software for the case of Sample 2, Figure S8: Unit-cell parameters, the corrected observed and calculated peak positions, and the respective difference obtained from the McMaille software for the case of Sample 3, Figure S9: vs. curve showing the Néel temperature for Sample 1, Figure S10: Variation of M along with M −1 vs. temperature for Sample 2 from 2 to 40 K; Table S1: Structural parameters, average crystallite size, together with conventional discrepancy factors from Rietveld refinement of XRD data for Sample 1, Sample 2, and Sample 3 [ 30 ], Table S2: Structural parameters, results of phase analysis together with conventional discrepancy factors from Rietveld refinement of XRD pattern for Sample 3, Table S3: Bond distances and bond angles for Sample 1, Sample 2, and Sample 3, Table S4: Structural parameters, average crystallite size, together with conventional discrepancy factors from Rietveld refinement of XRD data for Sample 3.…”