A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride

Baggott, A.; Mazaheri, Mehdi; Zhou, Yangbo; Zhang, H.; Inkson, Beverley J.

doi:10.1016/j.matchar.2018.05.006

Cited by 6 publications

(2 citation statements)

References 22 publications

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“…The ion inducing secondary electron generation ratio of hydrated proteins is lower than that of dehydrated proteins. IL-treated chromosomes may have been unable to produce sufficient secondary electrons compared to the CPD treated chromosomes, resulting in dark chromosome areas with depleted ion-induced secondary electron emission (Hill and Rahman 2011;Baggott et al 2018). The depleted secondary electron emission area occurred with the use of a highly insulating material.…”

Section: Discussionmentioning

confidence: 99%

Surface structures consisting of chromatin fibers in isolated barley (Hordeum vulgare) chromosomes revealed by helium ion microscopy

et al. 2021

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Section: Discussionmentioning

confidence: 99%

Surface structures consisting of chromatin fibers in isolated barley (Hordeum vulgare) chromosomes revealed by helium ion microscopy

et al. 2021

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“…Another effect that comes into play for investigations of semiconductors is the static capacitive effect, which is used to reveal dopant concentration changes even if quantification remains challenging [23,24]. An application, in which the electron flood gun has demonstrated its usefulness, has been reported by Baggott et al [25] for imaging ceramic silicon nitride samples. The edges of indented cracks and the intergranular glassy phase could be revealed when using charge compensation.…”

Section: Applicationsmentioning

confidence: 99%

Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope

Audinot¹,

Philipp²,

Castro³

et al. 2021

Rep. Prog. Phys.

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This paper is a review on the combination between Helium Ion Microscopy (HIM) and Secondary Ion Mass Spectrometry (SIMS), which is a recently developed technique that is of particular relevance in the context of the quest for high-resolution high-sensitivity nano-analytical solutions. We start by giving an overview on the HIM-SIMS concept and the underlying fundamental principles of both HIM and SIMS. We then present and discuss instrumental aspects of the HIM and SIMS techniques, highlighting the advantage of the integrated HIM-SIMS instrument. We give an overview on the performance characteristics of the HIM-SIMS technique, which is capable of producing elemental SIMS maps with lateral resolution below 20 nm, approaching the physical resolution limits, while maintaining a sub-nanometric resolution in the secondary electron microscopy mode. In addition, we showcase different strategies and methods allowing to take profit of both capabilities of the HIM-SIMS instrument (high-resolution imaging using secondary electrons and mass filtered secondary sons) in a correlative approach. Since its development HIM-SIMS has been successfully applied to a large variety of scientific and technological topics. Here, we will present and summarise recent applications of nanoscale imaging in materials research, life sciences and geology.

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Characterization and single track analysis of a metal-ceramic composite laser cladding over Ti6Al4V alloy

Kumar¹,

Mandal²,

Das³

et al. 2022

Applied Surface Science Advances

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A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride

Cited by 6 publications

References 22 publications

Surface structures consisting of chromatin fibers in isolated barley (Hordeum vulgare) chromosomes revealed by helium ion microscopy

Surface structures consisting of chromatin fibers in isolated barley (Hordeum vulgare) chromosomes revealed by helium ion microscopy

Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope

Characterization and single track analysis of a metal-ceramic composite laser cladding over Ti6Al4V alloy

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