A comparison of electronic-reliability prediction models

Jones, Jeffrey Alun; Hayes, J. A.

doi:10.1109/24.784270

Cited by 70 publications

(23 citation statements)

References 4 publications

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“…These differences can partly be explained by the matter of fact that they privilege more or less some influence factors [12]. The diversity of these results confirms the importance of accelerated ageing test under the conditions which are close to the mission profile of the system.…”

Section: Calculation Of Failure Ratessupporting

confidence: 57%

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

2004

Microelectronics Reliability

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To cite this version:Frédéric Perisse, Pascal Venet, Gérard Rojat. Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC. Microelectronics Reliability, Elsevier, 2004, 44 (9-11) AbstractThe lifetime of power electronic components is often calculated from reliability reports, but this method can be discussed. We compare in this article the results of various reliability reports to an accelerated ageing test of component and introduced the load-strength concept. Large aluminium electrolytic capacitors are taken here in example in the context of the protection system of LHC (Large Hadron Collider) in CERN where the level of reliability is essential. We notice important differences of MTBF (Mean Time Between Failure) according to the reliability report used. Accelerating ageing tests carried out prove that a Weibull law is more adapted to determinate failure rates of components. The load-strength concept associated with accelerated ageing tests can be a solution to determine the lifetime of power electronic components.

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Section: Calculation Of Failure Ratessupporting

confidence: 57%

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

2004

Microelectronics Reliability

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“…Because of their ease-to-use character in practical engineering situations, they are supported and implemented by many companies for evaluating the reliability of SEM [21].…”

Section: Introductionmentioning

confidence: 99%

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling

Yang

Chen

et al. 2014

International Journal of Electrical Power & Energy Systems

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“…Moreover, the suitability of this standard compared to other ones has been proved because of its different and more factors which cover all aspects of reliability and influential items [60]. This handbook uses two methods called parts count and parts stress to estimate the reliability of system components at various stages of design [47,61].…”

Section: Methodsmentioning

confidence: 99%

A Comparative Reliability Study of Three Fundamental Multilevel Inverters Using Two Different Approaches

2016

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Abstract:The reliability of power electronic devices and components is very important to manufacturers. In recent years, many researchers have conducted reliability assessments of power electronic devices, yet the reliability of numerous circuits used widely has not been evaluated. This paper presents a comprehensive reliability evaluation of fundamental multilevel inverters. The reliability of the multilevel inverters is analyzed by calculating the mean time to failure for each component. The calculation was performed by two methods (approximate and exact) to achieve better comparisons. The approximate method is similar to the parts count method used in MIL-HDBK-217 reliability standard, and the exact method exhibits the parts stress method. In the exact method, due to the direct relationship between component failure and temperature, we used Matlab Simulink to determine power losses in diodes and switches taking into account the temperature factor. The results determined by the approximate method showed that the three-level cascade H-bridge was the most reliable of the inverters considered. Although the exact method validates those results, and shows that cascade H-bridge (CHB) had a longer lifespan, but the calculated values are different. Therefore, using different approaches for evaluating reliability results in different outcomes.

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A comparison of electronic-reliability prediction models

Cited by 70 publications

References 4 publications

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

Smart electricity meter reliability prediction based on accelerated degradation testing and modeling

A Comparative Reliability Study of Three Fundamental Multilevel Inverters Using Two Different Approaches

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