2001
DOI: 10.1109/23.983134
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A comparison of charge transfer efficiency measurement techniques on proton damaged n-channel CCDs for the Hubble Space Telescope Wide-Field Camera 3

Abstract: We examine proton-damaged charge-coupled devices (CCDs) and compare the charge transfer efficiency (CTE) degradation using extended pixel edge response, first pixel response, and 55 Fe X-ray measurements. CTEs measured on Marconi and Fairchild imaging sensors CCDs degrade similarly at all signal levels, though some of the Fairchild CCDs had a supplementary buried channel.

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Cited by 25 publications
(39 citation statements)
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“…As the signal level increases, both the density of the charge packet and the volume occupied by it increase. Assuming bulk traps are uniformly distributed, there will be a larger number of traps per electron at small signal levels which may cause the commonly reported increase in CTI at small signal levels 8,9 .…”
Section: Charge Packet Modelsmentioning
confidence: 99%
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“…As the signal level increases, both the density of the charge packet and the volume occupied by it increase. Assuming bulk traps are uniformly distributed, there will be a larger number of traps per electron at small signal levels which may cause the commonly reported increase in CTI at small signal levels 8,9 .…”
Section: Charge Packet Modelsmentioning
confidence: 99%
“…A large portion of proton interactions will result in no damage to the detector where the displaced silicon atom finds its way back to its lattice site. However in a few instances the vacancy may migrate away from the initial lattice position until it becomes stable 9 .…”
Section: Radiation Damagementioning
confidence: 99%
“…The standard tool for measurement of CTE in CCDs is the analysis of the peak pixel intensity of 55 Fe x-ray generated charge packets collected in the silicon. We will not describe the process in detail here as it is well documented in the literature 2,12,14 .…”
Section: Charge Diffusion and Charge Transfer Efficiency Measurementmentioning
confidence: 99%
“…Other proposed solutions, including the summation of the charges in adjacent pixels, serve to destroy the information about short time constant traps. LSST will be using the 'extended pixel edge response' method that is well documented in the literature 12 . Work on other methods continues.…”
Section: Charge Diffusion and Charge Transfer Efficiency Measurementmentioning
confidence: 99%
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