1974
DOI: 10.1063/1.1663659
|View full text |Cite
|
Sign up to set email alerts
|

A comparison of calculated images generated by six modes of transmission electron microscopy

Abstract: Six modes of transmission electron microscopy (TEM) are compared by a numerical simulation of the image formation. The comparison includes five modes of the conventional electron microscope (CEM) (axial bright field, Unwin's phase plate, central stop dark field, tilted beam dark field, conical illumination dark field) and the annular detector mode of the scanning transmission electron microscope (STEM). It is assumed that the illumination is perfectly coherent and that the interaction between electron beam and… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
13
0

Year Published

1988
1988
2012
2012

Publication Types

Select...
3
3
2

Relationship

0
8

Authors

Journals

citations
Cited by 62 publications
(15 citation statements)
references
References 23 publications
2
13
0
Order By: Relevance
“…Recall that within the first 94 A much of the electron intensity is focused into the channeling peaks where it remains for at least 470 A. The small dependence on crystal thickness of the images is an advantage of STEM over CTEM, where phase-contrast reversals can complicate image interpretation (Engel et al, 1974). Values of the adatom signal, the background intensity, and the contrast for each image are listed in Table 1.…”
Section: Thickness Effects On Visibilitymentioning
confidence: 99%
See 1 more Smart Citation
“…Recall that within the first 94 A much of the electron intensity is focused into the channeling peaks where it remains for at least 470 A. The small dependence on crystal thickness of the images is an advantage of STEM over CTEM, where phase-contrast reversals can complicate image interpretation (Engel et al, 1974). Values of the adatom signal, the background intensity, and the contrast for each image are listed in Table 1.…”
Section: Thickness Effects On Visibilitymentioning
confidence: 99%
“…Because image formation for crystalline specimens is a complex nonlinear process, simple analytical descriptions are inadequate. Interference effects can lead to significant misinterpretation of results (Engel, Wiggins & Woodruff, 1974). Numerically intensive simulations are necessary as a guide to the O 1988 International Union of Crystallography correct interpretation.…”
Section: Introductionmentioning
confidence: 99%
“…The high contrast delivered by the dark-field detector system [15] can also be exploited in negative or positive stain microscopy [16]. Here the STEM yields clear single-shot images that are free from phase contrast fringes.…”
mentioning
confidence: 99%
“…The initial scatter contrast images of single atoms and clusters by Crewe and coworkers [65], as well as image simulations [87] showed the clear signature characteristics of an incoherent image, a single unique focus for the atoms and a resolution that is approximately p 2 better than phase contrast imaging. Also the images demonstrated increased Z-contrast, i.e., a stronger contrast as function of Z, as expected, since high angle scattering approaches the cross section for unscreened Rutherford scattering, which is proportional to Z 2 .…”
Section: Phase Contrast Versus Scatter Contrastmentioning
confidence: 99%
“…In parallel with the applications to biology was an analysis of the image contrast mechanism in TEM and STEM [86][87][88]. The contrast mechanisms are explained in detail in several books, e.g., those of Reimer [89] and Spence [90].…”
Section: Reciprocitymentioning
confidence: 99%