2011
DOI: 10.1002/xrs.1357
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A comparative study on determination of uranium and thorium in their mixed oxides by EDXRF using tube and radioisotope X‐ray sources

Abstract: Studies on the matrix effects of uranium and thorium on the determinations of each other in their mixed oxides using energy dispersive X‐ray fluorescence (EDXRF) spectrometry with tube and radioisotope excitations of U Lα and Th Lα are reported. An internal standard method for the determination of uranium and thorium in these mixed oxides is found suitable. Comparison of the analytical results of EDXRF determinations of uranium and thorium using tube and radioisotope excitation sources has been made. The analy… Show more

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Cited by 3 publications
(3 citation statements)
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“…It can be seen that the precision observed in the present case for uranium determinations (0.3%, 1 σ ) is much better compared with our earlier reported values in similar case using laboratory source of excitation . Similarly, the deviation of the EDXRF determined results with the expected value calculated on the basis of preparation of these pellets is 0.9% that is far better compared with our earlier reported values . The data for thorium determinations are comparable with those of uranium determination (deviation = 1% and precision = 0.2%).…”
Section: Resultssupporting
confidence: 70%
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“…It can be seen that the precision observed in the present case for uranium determinations (0.3%, 1 σ ) is much better compared with our earlier reported values in similar case using laboratory source of excitation . Similarly, the deviation of the EDXRF determined results with the expected value calculated on the basis of preparation of these pellets is 0.9% that is far better compared with our earlier reported values . The data for thorium determinations are comparable with those of uranium determination (deviation = 1% and precision = 0.2%).…”
Section: Resultssupporting
confidence: 70%
“…A live time of 300 s was used for spectrum measurement. The details of this instrument are described elsewhere . The spectrometer EX3600 TEC uses a Peltier‐cooled semiconductor premium Si PIN diode detector with a measured resolution of 155 eV at 5.9 keV (Mn Kα), whereas for synchrotron measurements, a silicon drift detector with a measured resolution of 138 eV at 5.9 keV (Mn Kα) was used.…”
Section: Xrf Measurementsmentioning
confidence: 99%
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