Abstract:Thin films of YBCO and thallium-based superconductor compounds have been deposited with very similar polycrystalline structures. The critical current densities carried by the YBCO films are much lower than measured in the thallium films (<10 3 , as opposed to >10 4 A/cm 2 ). Grain boundaries in these films have been studied to correlate microstructure with the measured electrical properties. High defect densities and frequent microcracking have been observed at and around the boundaries in the YBCO films, but … Show more
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