1976
DOI: 10.1109/proc.1976.10120
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A comparative study of noise properties of Si IMPATT diodes operating at 80 GHz

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Cited by 6 publications
(3 citation statements)
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“…Variations of noise measure (NM) of standalone IMPATT sources based on Wz‐GaN, 4H‐SiC, type‐IIb diamond, GaAs, InP, Si as well as the PCPC mode operated ( N = 10) G‐IMPATT source for both nonzero and zero applied gate potentials with operating frequency have been shown in Figure . It is already discussed by the author in his earlier report that the noise levels of G‐IMPATT sources are significantly smaller as compared with other IMPATT sources . It is observed in the present study that increase in electric field at the space points below the gate terminals due to the application of nonzero gate potential causes local impact ionization of the charge carriers around those regions.…”
Section: Characteristicssupporting
confidence: 60%
“…Variations of noise measure (NM) of standalone IMPATT sources based on Wz‐GaN, 4H‐SiC, type‐IIb diamond, GaAs, InP, Si as well as the PCPC mode operated ( N = 10) G‐IMPATT source for both nonzero and zero applied gate potentials with operating frequency have been shown in Figure . It is already discussed by the author in his earlier report that the noise levels of G‐IMPATT sources are significantly smaller as compared with other IMPATT sources . It is observed in the present study that increase in electric field at the space points below the gate terminals due to the application of nonzero gate potential causes local impact ionization of the charge carriers around those regions.…”
Section: Characteristicssupporting
confidence: 60%
“…The noise measure versus operating frequency plots obtained from simulation as well as experiment (where available in literature) of Wz‐GaN, 4H‐SiC. Type‐IIb diamond, Si, and PCPC mode operated ( N = 10) G‐IMPATT sources are shown in Figure . The noise measure of the diodes sharply decreases with the increase of operating frequency.…”
Section: Characteristics Of G‐impatt Sourcesmentioning
confidence: 99%
“…However, it can be observed from Figure 15 that noise measure of mutually injection locked ten-element G-IMPATT source operating at 94 GHz is only 26.20 dB, which is much smaller than the experimentally measures noise measure of standalone Si IMPATT source. 50 Also, the noise simulation of G-IMPATT sources operating in PCPC mode reveal that these sources are significantly less noisy as compared to the stand-alone IMPATT sources based on conventional semiconductor materials.…”
Section: F I G U R Ementioning
confidence: 97%