2021
DOI: 10.1016/j.mssp.2021.105935
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A comparative study of CdS thin films grown on ultra-thin glass substrates by RF magnetron sputtering and chemical bath deposition

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Cited by 28 publications
(20 citation statements)
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“…Other relatively weak peaks located at 44.05° and 52.33° correspond to the (220) and (311) planes, respectively, for the CdS phase with cubic structure i according to the card number PDF10‐0454 49 . The structural properties of the grown films are consistent with previous research on the structural properties of CdS thin films prepared on conducting glass/ITO utilizing thermal deposition, 50 chemical bath deposition, 51,52 electrodeposition, 53‐55 and RF magnetron sputtering methods 57,58 …”
Section: Resultssupporting
confidence: 86%
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“…Other relatively weak peaks located at 44.05° and 52.33° correspond to the (220) and (311) planes, respectively, for the CdS phase with cubic structure i according to the card number PDF10‐0454 49 . The structural properties of the grown films are consistent with previous research on the structural properties of CdS thin films prepared on conducting glass/ITO utilizing thermal deposition, 50 chemical bath deposition, 51,52 electrodeposition, 53‐55 and RF magnetron sputtering methods 57,58 …”
Section: Resultssupporting
confidence: 86%
“…This result is consistent with other studies describing the development of CdS thin films on conducting glass/ITO substrates employing CBD, 51,52 electrodeposition, [53][54][55] and RF magnetron deposition. 57,58 Raman spectroscopy is a very effective nondestructive technique for studying the structure of materials since it provides a quick and easy approach to identifying the different phases of a material, as well as its degree of crystallinity and whether it is amorphous, crystalline, or nanocrystalline. CdS Raman spectra analysis has received a lot of attention in the literature and compares Raman studies of CdS thin films conducted by various research groups.…”
Section: Resultsmentioning
confidence: 99%
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“…Bragg’s law is used to determine the crystallinity of the produced film in terms of lattice constant, phase, strain, and defect densities using XRD spectrum data. In a cubic structure, structural parameters are computed using Bragg’s law and Vegard’s law; where, n is the diffraction order, λ is the wavelength of the incident X-ray, θ is the diffraction angle and d is inter- planar spacing 40 . Consequently, the out and in plane lattice constant c, and a related to hexagonal unit cell can be estimated by; …”
Section: Resultsmentioning
confidence: 99%