A Comparative Study and Analysis of Various Interconnects for Very Large-Scale Integration

Abstract

We examined various interconnects utilised in very large-scale integration (VLSI). The expanding use of portable devices has increased the demand for low-power circuit design. Sub-threshold circuits are the greatest option to address the demand for even more-low power. However, decreased performance and increased variability are the main problems with sub-threshold circuits. Furthermore, global interconnects have a significant impact on the performance and power dissipation of sub-threshold circuits. For future VLSI circuit applications, interconnect is a brand-new and very promising alternative for which the propagation latency and stability must be analysed in order to substantiate its claim that it can replace existing interconnect designs.